5962-87664012A QP SEMICONDUCTOR, 5962-87664012A Datasheet - Page 13

• Manufacturer Part Number: 5962-87664012A
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-87664012A

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
NOTES:
1. Preferred method:
2. Alternate method:
3. C
4. R
5. R
6. Input signal from pulse generator: V
7. Timing parameters shall be tested at a minimum input frequency of 1 MHz.
8. The outputs are measured one at a time with one transition per measurement.
and from 2.7 V to 0.3 V, respectively; duty cycle = 50 percent.
L
L
T
When measuring t
When measuring t
When measuring t
When measuring t
When measuring t
= 50 pF minimum or equivalent (includes test jig and probe capacitance)
= 500Ω or equivalent
= 50Ω or equivalent
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
PHZ
PLZ
PLH
PLZ
PHZ
, t
and t
and t
and t
and t
PZH
FIGURE 4. Switching waveforms and test circuit – Continued.
, t
PZL
PZL
PHL
PZH
PLH
: V
: V
: V
: V
and t
test
test
test
test
IN
= 2 X V
= 2 X V
= 0.0 V to 3.0 V; PRR ≤ 10 MHz; t
= open
= GND
PHL
: V
test
CC
CC
= open
SIZE
A
r
≤ 3 ns; t
REVISION LEVEL
f
≤ 3 ns; measured from 0.3 V to 2.7 V
C
SHEET
5962-87664
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