5962-87664012A QP SEMICONDUCTOR, 5962-87664012A Datasheet - Page 7

• Manufacturer Part Number: 5962-87664012A
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-87664012A

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
Quiescent supply
Quiescent supply
Quiescent supply
Quiescent supply
Three-state output
Three-state output
Input capacitance
Power dissipation
Functional tests
See footnotes at end of table.
current delta,
TTL input levels
3005
current, outputs
high
3005
current, outputs
low
3005
current, outputs
three-state
3005
leakage current
high
3021
leakage current
low
3020
3012
capacitance
3014
test method 1/
MIL-STD-883
Test and
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
Symbol
ΔI
I
I
I
I
I
C
C
10/
CCH
OZH
CCL
CCZ
OZL
7/
8/
8/
8/
9/
PD
CC
IN
TABLE I. Electrical performance characteristics - Continued.
For input under test,
For all other inputs,
For all inputs, V
I
For all inputs, V
I
For all inputs, V
I
V
V
V
V
See 4.4.1b
T
See 4.4.1b
T
See 4.4.1c
V
Verify output V
V
V
OUT
OUT
OUT
C
C
IN
OUT
IN
OUT
IN
IN
IN
= +25°C
= +25°C, f = 1 MHz
= V
= V
= V
= V
= V
= 0.0 V
= 0.0 V
= 0.0 V
Unless otherwise specified
= 5.5 V
= 0.0 V
+4.5 V ≤ V
IH
IL
IH
Test conditions 2/,3/
-55°C ≤ T
CC
CC
or V
- 2.1 V
or GND
IL
OUT
IN
IN
IN
C
CC
= V
= V
= V
≤ +125°C
≤ +5.5 V
M,D
P,L,R
M
D
P,L,R
M
D
P,L,R
M
D
P,L,R
M,D,P,L,R
M,D,P,L,R
CC
CC
CC
or GND
or GND
or GND
SIZE
A
Device
Device
class
type
and
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
REVISION LEVEL
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.5 V
5.0 V
4.5 V
5.5 V
GND
V
CC
subgroups
C
Group A
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
7, 8
7, 8
1
1
1
1
1
1
4
4
Min
L
L
Limits 4/
SHEET
5962-87664
160.0
100.0
160.0
100.0
160.0
100.0
-10.0
-25.0
10.0
25.0
65.0
Max
1.6
1.6
3.5
1.0
3.5
1.0
3.5
1.0
3.5
8.0
H
H
7
Unit
mA
mA
mA
mA
mA
μA
μA
μA
μA
μA
μA
μA
pF
pF