CAT5409YI-50-T2 ON Semiconductor, CAT5409YI-50-T2 Datasheet - Page 6

• Manufacturer Part Number: CAT5409YI-50-T2
• Description: IC POT DPP QUAD 64TAP I2C 24TSSO
• Manufacturer: ON Semiconductor

Specifications of CAT5409YI-50-T2

• Taps: 64
• Resistance (ohms): 50K
• Number Of Circuits: 4
• Temperature Coefficient: 300 ppm/°C Typical
• Memory Type: Non-Volatile
• Interface: I²C, 2-Wire Serial
• Voltage - Supply: 2.5 V ~ 6 V
• Operating Temperature: -40°C ~ 85°C
• Mounting Type: Surface Mount
• Package / Case: 24-TSSOP
• Resistance In Ohms: 50K
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

9. The write cycle is the time from a valid stop condition of a write sequence to the end of the internal program/erase cycle. During the write
10. This parameter is tested initially and after a design or process change that affects the parameter.
11. t
Table 7. A.C. CHARACTERISTICS
Table 8. POWER UP TIMING
Table 9. WRITE CYCLE LIMITS
Table 10. RELIABILITY CHARACTERISTICS
I
LTH
cycle, the bus interface circuits are disabled, SDA is allowed to remain high, and the device does not respond to its slave address.
PUR
N
V
t
T
BUF
END
T
t
ZAP
t
DR
R
F
(Notes 10, 11)
I
Symbol
Symbol
Symbol
Symbol
and t
t
t
t
t
(Note 10)
t
(Note 10)
(Note 10)
SU:STO
HD:STA
SU:STA
HD:DAT
SU:DAT
t
t
t
t
(Note 10)
f
(Note 10)
HIGH
LOW
PUW
t
(Note 10)
t
PUR
(Note 10)
SCL
t
WR
AA
DH
PUW
are delays required from the time V
Clock Frequency
Noise Suppression Time Constant at SCL, SDA Inputs
SLC Low to SDA Data Out and ACK Out
Time the bus must be free before a new transmission can start
Start Condition Hold Time
Clock Low Period
Clock High Period
Start Condition SetupTime (for a Repeated Start Condition)
Data in Hold Time
Data in Setup Time
SDA and SCL Rise Time
SDA and SCL Fall Time
Stop Condition Setup Time
Data Out Hold Time
Power−up to Read Operation
Power−up to Write Operation
Write Cycle Time
ESD Susceptibility
Data Retention
Parameter
Endurance
Latch−Up
(Note 10)
(Note 9)
(Over recommended operating conditions unless otherwise stated.)
CC
Parameter
MIL−STD−883, Test Method 1033
MIL−STD−883, Test Method 1008
MIL−STD−883, Test Method 3015
JEDEC Standard 17
is stable until the specified operation can be initiated.
http://onsemi.com
Reference Test Method
Parameter
Parameter
6
1,000,000
Min
100
1.2
0.6
1.2
0.6
0.6
0.6
50
0
2000
Min
100
100
Typ
Max
Max
Max
Max
400
300
0.9
0.3
50
1
1
5
Cycles/Byte
Units
Years
mA
V
Units
Units
Units
kHz
ms
ms
ms
ns
ms
ms
ms
ms
ms
ms
ns
ns
ms
ns
ms
ns