P87C51FB-4B,557 NXP Semiconductors, P87C51FB-4B,557 Datasheet - Page 42
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P87C51FB-4B,557
Manufacturer Part Number
P87C51FB-4B,557
Description
Manufacturer
NXP Semiconductors
Datasheet
1.P87C51FB-4B.pdf
(56 pages)
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Philips Semiconductors
2000 Aug 07
AC inputs during testing are driven at V
NOTE:
Timing measurements are made at V
80C51 8-bit microcontroller family
8K–64K/256–1K OTP/ROM/ROMless, low voltage (2.7V–5.5V),
low power, high speed (33MHz)
V
CC
0.45V
–0.5
Figure 34. AC Testing Input/Output
0.2V
0.2V
IH
CC
CC
CC
min for a logic ‘1’ and V
+0.9
–0.1
–0.5 for a logic ‘1’ and 0.45V for a logic ‘0’.
Valid only within frequency specifications of the device under test
35
30
25
20
15
10
5
I
CCMAX
I
CCMAX
IL
4
(8XC51RD+)
max for a logic ‘0’.
= 0.9 X FREQ + 2.1
ACTIVE MODE
8
SU00717
Figure 36. I
12
FREQ AT XTAL1 (MHz)
TYP ACTIVE MODE
16
42
CC
20
vs. FREQ
MAX IDLE MODE
NOTE:
For timing purposes, a port is no longer floating when a 100mV change from
load voltage occurs, and begins to float when a 100mV change from the loaded
V
V
OH
LOAD
24
TYP IDLE MODE
/V
OL
MAX ACTIVE
MODE (EXCEPT
8XC51RD+)
I
FREQ. + 1.1
CC
level occurs. I
28
V
V
MAX = 0.9 X
LOAD
LOAD
32
SU00837A
–0.1V
+0.1V
8XC51RA+/RB+/RC+/RD+/80C51RA+
OH
Figure 35. Float Waveform
/I
36
OL
20mA.
8XC51FA/FB/FC/80C51FA
REFERENCE
TIMING
POINTS
Product specification
8XC54/58
V
V
OH
OL
SU00718
+0.1V
–0.1V
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