DS2174Q+ Maxim Integrated Products, DS2174Q+ Datasheet - Page 9

IC BERT ENHANCED 44-PLCC

DS2174Q+

Manufacturer Part Number
DS2174Q+
Description
IC BERT ENHANCED 44-PLCC
Manufacturer
Maxim Integrated Products
Datasheet

Specifications of DS2174Q+

Function
Enhanced Bit Error Rate Tester (EBERT)
Interface
E1, J1, T1
Number Of Circuits
1
Voltage - Supply
3 V ~ 3.6 V
Current - Supply
50mA
Operating Temperature
0°C ~ 70°C
Mounting Type
Surface Mount
Package / Case
*
Includes
Error Counter, Pattern Generator and Detector
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Power (watts)
-
Signal Name:
Signal Description: TEST Input
Signal Type:
Test Input. Should be left floating or held high.
Signal Name:
Signal Description: Transmit Clock
Signal Type:
Transmit Clock Input. Up to a 155MHz clock to operate the transmit circuit. Data is output at TDATn
and is updated on the rising edge of TCLK.
Signal Name:
Signal Description: Transmit Clock Enable
Signal Type:
Gaps the TCLK input to the transmit circuit.
Signal Name:
Signal Description: TCLK Output
Signal Type:
Output of the TCLK gapping circuit. Gapped by TCLK_EN.
Signal Name:
Signal Description: Transmit Data Outputs
Signal Type:
TDAT0. Transmit serial data/receive data bit 0 in nibble and byte mode
TDAT1.Transmit data bit 1 in nibble and byte mode
TDAT2. Transmit data bit 2 in nibble and byte mode
TDAT3. Transmit data bit 3 in nibble and byte mode
TDAT4. Transmit data bit 4 in byte mode
TDAT5. Transmit data bit 5 in byte mode
TDAT6. Transmit data bit 6 in byte mode
TDAT7. Transmit data bit 7 in byte mode
Signal Name:
Signal Description: Data I/O
Signal Type:
Parallel data pins.
TEST
Input (with internal 10kΩ pullup)
TCLK
Input
TCLK_EN
Input
TCLKO
Output
TDAT0 to TDAT7
Output
D0 to D7
I/O
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