STM8S003F3 STMicroelectronics, STM8S003F3 Datasheet - Page 86

no-image

STM8S003F3

Manufacturer Part Number
STM8S003F3
Description
Value line, 16 MHz STM8S 8-bit MCU, 8 Kbytes Flash, 128 bytes data EEPROM
Manufacturer
STMicroelectronics
Datasheet

Specifications of STM8S003F3

Program Memory
8 Kbytes Flash; data retention 20 years at 55 °C after 100 cycles
Data Memory
128 bytes of true data EEPROM; endurance up to 100 000 write/erase cycles
Ram
1 Kbytes
Advanced Control Timer
16-bit, 4 CAPCOM channels, 3 complementary outputs, dead-time insertion and flexible synchronization

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
STM8S003F3
Manufacturer:
ST
0
Part Number:
STM8S003F3P3
Manufacturer:
ST
0
Part Number:
STM8S003F3P6
Manufacturer:
ST
Quantity:
2 960
Part Number:
STM8S003F3P6
Manufacturer:
ST
Quantity:
235
Part Number:
STM8S003F3P6
Manufacturer:
ST
0
Part Number:
STM8S003F3P6
Manufacturer:
ST
Quantity:
120
Part Number:
STM8S003F3P6
Manufacturer:
ST
Quantity:
20 000
Part Number:
STM8S003F3P6
0
Company:
Part Number:
STM8S003F3P6
Quantity:
5 000
Company:
Part Number:
STM8S003F3P6
Quantity:
68 080
Company:
Part Number:
STM8S003F3P6
Quantity:
60 000
Company:
Part Number:
STM8S003F3P6
Quantity:
50 000
Company:
Part Number:
STM8S003F3P6
Quantity:
30 000
Part Number:
STM8S003F3P6.
Manufacturer:
ST
Quantity:
15 000
Part Number:
STM8S003F3P6TR
Manufacturer:
TI
Quantity:
7 710
Electrical characteristics
9.3.11.3
86/99
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
recovered by applying a low state on the NRST pin or the oscillator pins for 1 second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring. See application note AN1015 (Software techniques
for improving microcontroller EMC performance).
Electromagnetic interference (EMI)
Based on a simple application running on the product (toggling 2 LEDs through the I/O ports),
the product is monitored in terms of emission. This emission test is in line with the norm SAE
IEC 61967-2 which specifies the board and the loading of each pin.
Symbol
Symbol
V
V
(1)
in AN2860 (EMC guidelines for STM8S microcontrollers).
FESD
EFTB
S
Data obtained with HSI clock configuration, after applying HW recommendations described
EMI
Parameter
Voltage limits to be
applied on any I/O pin to
induce a functional
disturbance
Fast transient voltage
burst limits to be applied
through 100 pF on V
and V
functional disturbance
Parameter
Peak level
SS
pins to induce a
Conditions
General
conditions
V
T
LQFP32
package
A
DD
= 25 °C
= 5 V
DocID018576 Rev 2
DD
Table 47: EMS data
Conditions
Table 48: EMI data
V
(HSI clock), conforming to IEC 61000-4-2
V
(HSI clock),conforming to IEC 61000-4-4
DD
DD
Monitored
frequency band
= 3.3 V, T
0.1 MHz to
30 MHz
30 MHz to
= 3.3 V, T
A
A
= 25 °C ,f
= 25 °C, f
Max f
16 MHz/
8 MHz
5
4
MASTER
MASTER
STM8S003K3 STM8S003F3
HSE
/f
= 16 MHz
= 16 MHz
16 MHz/
16 MHz
CPU
5
5
(1)
Level/
class
2/B
4/A
dBμV
Unit
(1)
(1)

Related parts for STM8S003F3