AP1002BMX Advanced Power Electronics Corp., AP1002BMX Datasheet - Page 2

The AP1002BMX used the latest APEC Power MOSFET silicon technology with the advanced technology packaging to provide the lowest on-resistance loss, low profile and dual sided cooling compatible

AP1002BMX

Manufacturer Part Number
AP1002BMX
Description
The AP1002BMX used the latest APEC Power MOSFET silicon technology with the advanced technology packaging to provide the lowest on-resistance loss, low profile and dual sided cooling compatible
Manufacturer
Advanced Power Electronics Corp.
Datasheet

Specifications of AP1002BMX

Vds
30V
Vgs
±20V
Rds(on) / Max(m?) Vgs@10v
1.8
Rds(on) / Max(m?) Vgs@4.5v
3
Qg (nc)
29
Qgs (nc)
6.5
Qgd (nc)
14
Id(a)
180
Pd(w)
89
Configuration
Single N
Package
GreenFET-MX
THIS PRODUCT IS SENSITIVE TO ELECTROSTATIC DISCHARGE, PLEASE HANDLE WITH CAUTION.
USE OF THIS PRODUCT AS A CRITICAL COMPONENT IN LIFE SUPPORT OR OTHER SIMILAR SYSTEMS IS NOT AUTHORIZED.
APEC DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED
HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
APEC RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE
RELIABILITY, FUNCTION OR DESIGN.
BV
R
V
g
I
I
Q
Q
Q
t
t
t
C
C
C
R
I
I
V
t
Q
Notes:
1.Pulse width limited by Max junction temperature.
2.Pulse test
3.Surface mounted on 1 in
4.T
5.Starting T
Electrical Characteristics@T
Source-Drain Diode
AP1002BMX
DSS
GSS
d(on)
r
f
S
SM
rr
fs
GS(th)
SD
DS(ON)
iss
oss
rss
g
g
gs
gd
rr
DSS
C
Symbol
Symbol
measured with thermocouple mounted to top (Drain) of part.
j
=25
Continuous Source Current ( Body Diode )
o
Drain-Source Breakdown Voltage
Static Drain-Source On-Resistance
Gate Threshold Voltage
Forward Transconductance
Drain-Source Leakage Current
Drain-Source Leakage Current (T
Gate-Source Leakage
Total Gate Charge
Gate-Source Charge
Gate-Drain ("Miller") Charge
Turn-on Delay Time
Rise Time
Turn-off Delay Time
Fall Time
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
Pulsed Source Current ( Body Diode )
Forward On Voltage
Reverse Recovery Time
Reverse Recovery Charge
C , L=0.1mH , R
2
copper pad of FR4 board.
Parameter
Parameter
G
=25Ω
2
2
2
j
=25
j
=125
o
C(unless otherwise specified)
1
o
2
C)
V
V
V
V
V
V
V
V
I
V
V
V
I
R
R
V
V
f=1.0MHz
f=1.0MHz
I
I
dI/dt=100A/µs
D
D
S
S
GS
GS
GS
DS
DS
DS
DS
GS
DS
GS
DS
GS
DS
G
D
=25A, V
=25A, V
=25A
=25A
= 1.2 Ω,V
= 0.64 Ω
=0V, I
=10V, I
=4.5V, I
=V
=10V, I
=24V, V
=24V ,V
= +20V, V
=15V
=4.5V
=16V
=0V
=25V
GS
Test Conditions
Test Conditions
, I
D
GS
GS
D
=250uA
D
D
D
=250uA
GS
GS
=25A
=0V
=0V,
=32A
=25A
GS
DS
=0V
=0V
= 10 V
=0V
Min.
Min.
1.2
30
45
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
3350 5360
1000
Typ.
Typ.
320
1.3
1.9
6.5
1.3
80
29
14
14
90
36
11
55
75
-
-
-
-
-
-
-
-
+100
Max. Units
Max. Units
2.35
150
113
110
250
1.8
46
83
3
1
1
-
-
-
-
-
-
-
-
-
-
-
mΩ
mΩ
nC
nC
nC
nC
uA
uA
nA
pF
pF
pF
ns
ns
ns
ns
ns
Ω
V
V
S
A
A
V
2

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