CD4025BMS Intersil Corporation, CD4025BMS Datasheet - Page 6

• Manufacturer Part Number: CD4025BMS
• Description: Rad-hard Cmos Nor Gate
• Manufacturer: Intersil Corporation

NOTE:
Intersil products are sold by description only. Intersil Corporation reserves the right to make changes in circuit design and/or specifications at any time without
notice. Accordingly, the reader is cautioned to verify that data sheets are current before placing orders. Information furnished by Intersil is believed to be accurate
and reliable. However, no responsibility is assumed by Intersil or its subsidiaries for its use; nor for any infringements of patents or other rights of third parties which
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of Intersil or its subsidiaries.
PART NUMBER CD4000BMS
Static Burn-In 1
Note 1
Static Burn-In 2
Note 1
Dynamic Burn-
In Note 1
Irradiation
Note 2
PART NUMBER CD4001BMS
Static Burn-In 1
Note 1
Static Burn-In 2
Note 1
Dynamic Burn-
In Note 1
Irradiation
Note 2
PART NUMBER CD4002BMS
Static Burn-In 1
Note 1
Static Burn-In 2
Note 1
Dynamic Burn-
In Note 1
Irradiation
Note 2
PART NUMBER CD4025BMS
Static Burn-In 1
Note 1
Static Burn-In 2
Note 1
Dynamic Burn-
In Note 1
Irradiation
Note 2
Group E Subgroup 2
1. Each pin except VDD and GND will have a series resistor of 10K
2. Each pin except VDD and GND will have a series resistor of 47K 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD
All Intersil semiconductor products are manufactured, assembled and tested under ISO9000 quality systems certification.
FUNCTION
= 10V
CONFORMANCE GROUPS
0.5V
Specifications CD4000BMS, CD4001BMS, CD4002BMS, CD4025BMS
1, 2, 6, 9, 10
1, 2, 6, 9, 10
1, 2, 6, 9, 10
3, 4, 10, 11
3, 4, 10, 11
3, 4, 10, 11
1, 6, 8, 13
1, 6, 8, 13
1, 6, 8, 13
6, 9, 10
6, 9, 10
6, 9, 10
OPEN
1, 2
6, 8
-
-
For information regarding Intersil Corporation and its products, see web site http://www.intersil.com
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
3 - 5, 7, 8, 11 - 13
1 - 5, 7, 8, 11 - 13
1, 2, 5 - 9, 12, 13
MIL-STD-883
2 - 5, 7, 9 - 12
METHOD
GROUND
5005
7
7
7
7
7
7
7
7
7
7
7
7
TABLE 7. TOTAL DOSE IRRADIATION
3 - 5, 8, 11 - 14
3 - 5, 8, 11 - 14
2 - 5, 9 - 12, 14
2 - 5, 9 - 12, 14
1 - 5, 8, 11 - 14
1 - 5, 8, 11 - 14
1, 2, 5, 6, 8, 9,
1, 2, 5, 6, 8, 9,
PRE-IRRAD
12 - 14
12 - 14
1, 7, 9
VDD
14
14
14
14
14
14
14
14
654
5%, VDD = 18V
TEST
POST-IRRAD
3, 4, 10, 11
9V
Table 4
6, 9, 10
6, 9, 10
1, 13
-0.5V
0.5V
3 - 5, 8, 11 - 13
1 - 5, 8, 11 - 13
1, 2, 5, 6, 8, 9,
PRE-IRRAD
2 - 5, 9 - 12
50kHz
12, 13
1, 9
READ AND RECORD
OSCILLATOR
POST-IRRAD
Table 4
25kHz