22C10 CatalystSemiconductor, 22C10 Datasheet - Page 3

• Manufacturer Part Number: 22C10
• Description: 256-BitNonvolatileCMOSStaticRAM
• Manufacturer: CatalystSemiconductor

CAPACITANCE T
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) The minimum DC input voltage is -0.5V. During transitions, inputs may undershoot to -2.0V for periods of less than 20 ns. Maximum DC
(3) Output shorted for no more than one second. No more than one output shorted at a time.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from -1V to V
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................. –55 C to +125 C
Storage Temperature ....................... –65 C to +150 C
Voltage on Any Pin with
V
Package Power Dissipation
Lead Soldering Temperature (10 secs) ............ 300 C
Output Short Circuit Current
RELIABILITY CHARACTERISTICS
D.C. OPERATING CHARACTERISTICS
V
CC
CC
Symbol
Symbol
Symbol
N
T
V
I
voltage on output pins is V
LTH
Respect to Ground
Capability (Ta = 25 C) ................................... 1.0W
I
I
I
I
V
V
V
V
V
C
C
DR
ZAP
CC
SB
LI
LO
END
with Respect to Ground ................ -2.0V to +7.0V
IH
IL
OH
OL
DH
= +5V 10%, unless otherwise specified.
I/O
IN
(1)
(1)(4)
(1)
(1)
(1)
(1)
Current Consumption
(Operating)
Current Consumption
(Standby)
Input Current
Output Leakage Current
High Level Input Voltage
Low Level Input Voltage
High Level Output Voltage
Low Level Output Voltage
RAM Data Holding Voltage
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Parameter
A
Input/Output Capacitance
Input Capacitance
= 25 C, f = 1.0 MHz, V
Parameter
(2)
CC
.............. -2.0 to +VCC +2.0V
+0.5V, which may overshoot to V
(3)
Parameter
........................ 100 mA
100,000
2000
Min.
100
10
CC
= 5V
Min.
2.4
1.5
2
0
Max.
CC
3
+2.0V for periods of less than 20 ns.
Limits
Typ.
Cycles/Byte
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation
of the device at these or any other conditions outside of
those listed in the operational sections of this specifica-
tion is not implied. Exposure to any absolute maximum
rating for extended periods may affect device perfor-
mance and reliability.
Max.
10
Units
Years
6
Volts
mA
Max.
V
0.8
0.4
5.5
40
30
10
10
CC
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
Unit
pF
pF
Reference Test Method
CC
Unit
mA
V
V
V
V
V
+1V.
A
A
A
All Inputs = 5.5V
T
All I/O’s Open
CS = V
All I/O’s Open
0
0
I
I
V
OH
OL
A
CC
= 0 C
= 4.2mA
V
V
= –2mA
Conditions
Doc. No. 25018-0A 2/98 N-1
Conditions
IN
OUT
V
V
I/O
CC
IN
5.5V
= 0V
= 0V
5.5V