ep2a40b724i8 Altera Corporation, ep2a40b724i8 Datasheet - Page 66

• Manufacturer Part Number: ep2a40b724i8
• Description: Programmable Logic Device Family
• Manufacturer: Altera Corporation

APEX II Programmable Logic Device Family Data Sheet
Generic Testing
Operating
Conditions
66
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For more information, see the following documents:
Each APEX II device is functionally tested. Complete testing of each
configurable static random access memory (SRAM) bit and all logic
functionality ensures 100% yield. AC test measurements for APEX II
devices are made under conditions equivalent to those shown in
Figure
all stages of the production flow. AC test criteria include:
Figure 37. APEX II AC Test Conditions
APEX II devices are offered in both commercial and industrial grades.
However, industrial-grade devices may have limited speed-grade
availability.
Application Note 39 (IEEE Std. 1149.1 (JTAG) Boundary-Scan Testing in
Altera Devices)
Jam Programming & Test Language Specification
Power supply transients can affect AC measurements.
Simultaneous transitions of multiple outputs should be avoided for
accurate measurement.
Threshold tests must not be performed under AC conditions.
Large-amplitude, fast-ground-current transients normally occur as
the device outputs discharge the load capacitances. When these
transients flow through the parasitic inductance between the device
ground pin and the test system ground, significant reductions in
observable noise immunity can result.
37. Multiple test patterns can be used to configure devices during
Device
Output
Device input
rise and fall
times < 3 ns
C1 (includes
jig capacitance)
To Test
System
Altera Corporation