tle8262-2e Infineon Technologies Corporation, tle8262-2e Datasheet - Page 67
![no-image](/images/no-image-200.jpg)
tle8262-2e
Manufacturer Part Number
tle8262-2e
Description
Universal System Basis Chip Hermes
Manufacturer
Infineon Technologies Corporation
Datasheet
1.TLE8262-2E.pdf
(94 pages)
- Current page: 67 of 94
- Download datasheet (2Mb)
Figure 33
13.2.3
The Test pin is used to set the SBC chip into SBC Software Development Mode. When the Test pin is connected
to GND, the SBC starts in SBC Software Development Mode. When the pin is left open, or connected to
SBC starts into normal operation. Please refer to
(switched ON only during SBC Init Mode) to prevent the SBC device from starting in SBC Software Development
Mode during normal life of the vehicle, as for example when the battery has been disconnected. To avoid
disturbance, the Test pin is monitored during the Init Mode (from the time
pin is low for the Init Mode time, Software Development Mode is reached. The mode is stored during the complete
time where
OFF mode.
Data Sheet
V
LH_PL/ Test block diagram
Test Pin
S
is above
LH_ PL / test
V
UVOFF
V
S
. It means to leave Software Development Mode, the SBC must go back to SBC
R
LH_ PL
T
T
test
LH_PL
Figure
67
Limp home
SBC Init
mode
3. The Test pin has an integrated pull-up resistor
LH_P L_test. vsd
V
S
>
V
UVON
until Init Mode is left). If the
Rev. 1.0, 2009-05-26
TLE8262-2E
Limp Home
V
s
the
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