s-8211caj-m5t1g Seiko Instruments Inc., s-8211caj-m5t1g Datasheet - Page 12

• Manufacturer Part Number: s-8211caj-m5t1g
• Description: Battery Protection Ic For 1-cell Pack
• Manufacturer: Seiko Instruments Inc.

*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
*1. Since products are not screened at high and low temperature, the specification for this temperature range is guaranteed
12
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
DELAY TIME (Ta = −40 to +85 °C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
DELAY TIME (Ta = 25 °C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
DELAY TIME (Ta = −40 to +85 °C)
Overcharge detection delay time
Overdischarge detection delay time
Discharge overcurrent detection delay time
Load short-circuiting detection delay time
Charge overcurrent detection delay time
BATTERY PROTECTION IC FOR 1-CELL PACK
S-8211C Series
by design, not tested in production.
by design, not tested in production.
(3) S-8211CAD
(4) S-8211CAE, S-8211CAT, S-8211CAX, S-8211CBR
Item
Item
*1
*1
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
CU
DL
DIOV
SHORT
CIOV
CU
DL
DIOV
SHORT
CIOV
CU
DL
DIOV
SHORT
CIOV
CU
DL
DIOV
SHORT
CIOV
Symbol
Symbol
Seiko Instruments Inc.
Table 12
Table 13
Condition
Condition
−
−
−
−
−
−
−
−
−
−
−
−
−
−
−
−
−
−
−
−
14.5
0.96
14.5
Min.
Min.
115
240
150
120
240
150
7.2
7.2
0.7
30
82
20
10
83
10
5
5
Typ.
Typ.
143
300
143
300
150
300
150
300
1.2
1.2
38
18
38
18
18
18
9
9
9
9
Max. Unit
Max. Unit
172
360
240
540
180
360
255
540
1.4
2.0
46
22
11
65
30
15
22
11
30
15
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
µs
µs
µs
µs
s
s
Rev.5.0
Condi-
Condi-
Test
Test
tion
tion
10
10
10
10
10
10
10
10
10
10
10
10
9
9
9
9
9
9
9
9
Circuit
Circuit
Test
Test
_00
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5