mc9s12uf32 Freescale Semiconductor, Inc, mc9s12uf32 Datasheet - Page 111

• Manufacturer Part Number: mc9s12uf32
• Description: System Chip Guide V01.05
• Manufacturer: Freescale Semiconductor, Inc

A.2.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
Freescale Semiconductor
NOTE:
Conditions are shown in Table A-4 unless otherwise noted
Num C
NOTES:
1. Data Retention at maximum guaranteed device operating temperature up to 1 year.
1
2
1
C
C Flash number of Program/Erase cycles
All values shown in Table A-10 are target values and subject to further extensive
characterization.
Data Retention at an average junction temperature of
T
Javg
= 85
o
C
Table A-10 NVM Reliability Characteristics
Rating
System on a Chip Guide — 9S12UF32DGV1/D V01.05
Symbol
t
NVMRET
n
FLPE
10,000
Min
15
Typ Max
Cycles
Years
Unit
111