lrs1386 Sharp Microelectronics of the Americas, lrs1386 Datasheet - Page 22
lrs1386
Manufacturer Part Number
lrs1386
Description
Flash Memory
Manufacturer
Sharp Microelectronics of the Americas
Datasheet
1.LRS1386.pdf
(114 pages)
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12. AC Electrical Characteristics for Flash Memory
12.1 AC Test Conditions
12.2 Read Cycle
Note:
Input pulse level
Input rise and fall time
Input and Output timing Ref. level
Output load
t
t
t
t
t
t
t
t
t
t
AVAV
AVQV
ELQV
APA
GLQV
PHQV
EHQZ
ELQX
GLQX
OH
1. Sampled, not 100% tested.
2. F-OE may be delayed up to t
Symbol
, t
GHQZ
Read Cycle Time
Address to Output Delay
F-CE to Output Delay
Page Address Access Time
F-OE to Output Delay
F-RST High to Output Delay
F-CE or F-OE to Output in High - Z, Whichever Occurs First
F-CE to Output in Low - Z
F-OE to Output in Low - Z
Output Hold from First Occurring Address, F-CE or F-OE change
ELQV
t
GLQV
Parameter
after the falling edge of F-CE without impact to t
L R S1 3 8 6
1TTL + C
0 V to 2.7 V
1.35 V
5 ns
L
(50pF)
(T
A
= -25°C to +85°C, F-V
Notes
2
2
1
1
1
1
Min.
ELQV
90
0
0
0
.
CC
Max.
150
90
90
35
20
20
= 2.7V to 3.3V)
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
20
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