mtfdbac030mae-1c1es Micron Semiconductor Products, mtfdbac030mae-1c1es Datasheet - Page 16

• Manufacturer Part Number: mtfdbac030mae-1c1es
• Description: C200 1.8-inch Nand Flash Ssd
• Manufacturer: Micron Semiconductor Products

Reliability
Mean Time Between Failures
Endurance
PDF: 09005aef83687459
realssd_c200_1_8.pdf - Rev. C 9/09 EN
Notes:
Micron’s SSDs incorporate advanced technology for defect and error management.
They use various combinations of hardware-based error correction algorithms and firm-
ware-based static and dynamic wear-leveling algorithms.
Over the life of the SSD, uncorrectable errors may occur. An uncorrectable error is de-
fined as data that is reported as successfully programmed to the SSD but when it is read
out of the SSD, the data differs from what was programmed.
Table 8: Uncorrectable Bit Error Rate
Mean time between failures (MTBFs) for the SSD can be predicted based on the compo-
nent reliability data using the methods referenced in the Telcordia SR-332 reliability
prediction procedures for electronic equipment.
Table 9: MTBFs
Endurance for the SSD can be predicted based on the usage conditons applied to the
device, the internal NAND component cycles, the write amplification factor, and the wear-
leveling efficency of the drive. The table below shows the drive lifetime for each SSD
density based on predefined usage conditions.
Table 10: Drive Lifetime
Uncorrectable Bit Error Rate
<1 sector per 10
Density
30GB
60GB
120GB
Density
30GB
60GB
120GB
1. Total bytes written calculated with the drive 90% full.
2. Access patterns consist of the following: 5% are 4k; 5% are 8k; 10% are 16k; 10% are
3. GB/day can be calculated by dividing the total bytes written value by (365 × number of
32k; 35% are 64K; and 35% are 128k.
years).
15
bits read
16
Drive Lifetime (Total Bytes Written)
Micron Technology, Inc. reserves the right to change products or specifications without notice.
MTBF (Operating Hours)
C200 1.8-Inch NAND Flash SSD
21TB
42TB
85TB
1 million
1 million
1 million
©2007 Micron Technology, Inc. All rights reserved.
Operation
READ
Reliability