m28f010 Intel Corporation, m28f010 Datasheet - Page 15

• Manufacturer Part Number: m28f010
• Description: 1024k 128k X 8 Cmos Flash Memory
• Manufacturer: Intel Corporation

AC TESTING INPUT OUTPUT WAVEFORM
AC TEST CONDITIONS
Input Rise and Fall Times (10% to 90%)
Input Pulse Levels
Input Timing Reference Level
Output Timing Reference Level
AC CHARACTERISTICS Read-Only Operations
NOTE
1 Whichever occurs first
t
t
t
t
t
t
t
t
t
AVAV
ELQV
AVQV
GLQV
ELQX
GLQX
GHQZ
OH
WHGL
Versions
AC Testing Inputs are driven at V
a logic ‘‘0’’ Testing measurements are made at V
‘‘1’’ and V
Symbol
t
t
t
t
t
t
t
LZ
RC
CE
ACC
OE
OLZ
DF
IL
for a logic ‘‘0’’ Rise Fall time
Read Cycle Time
Chip Enable
Access Time
Address Access
Time
Output Enable
Access Time
Chip Enable to
Output in Low Z
Output Enable to
Output in Low Z
Output Disable to
Output in High Z
Output Hold from
Address CE
or OE Change
Write Recovery
Time before Read
Characteristic
(1)
OH1
for a logic ‘‘1’’ and V
M28F010-90 M28F010-12 M28F010-15 M28F010-20 M28F010-25
Min
90
s
0
0
0
6
10 ns
V
OL
Max
IH
V
V
271111 – 7
90
90
40
30
IL
IL
and V
for a logic
and V
and V
OL
10 ns
Min
120
OH1
for
0
0
0
6
IH
IH
Max
120
120
50
30
AC LOAD CIRCUIT
Min
150
C
C
0
0
0
6
L
L
includes Jig Capacitance
e
100 pF
Max
150
150
55
35
Min
200
0
0
0
6
Max
200
200
60
45
Min
250
0
0
0
6
271111 – 8
M28F010
Max
250
250
65
60
Unit
ns
ns
ns
ns
ns
ns
ns
ns
ms
15