mu9c4481l-10dc Music Semiconductors, Inc., mu9c4481l-10dc Datasheet - Page 18

• Manufacturer Part Number: mu9c4481l-10dc
• Description: Lancam 1st Family
• Manufacturer: Music Semiconductors, Inc.

LANCAM 1
Rev. 1a
Notes:
1. -1.0V for a duration of 10 ns measured at the 50% amplitude points for Input-only lines (Figure 5).
2. Common I/O lines are clamped, so that signal transients cannot fall below -0.5V.
3. At 0 – 70°C and Vcc(min) to Vcc(max).
4. See Table 6.
5. Control signals are /W and /CM.
6. With load specified in Figure 4, Test Load A.
7. With load specified in Figure 4, Test Load B.
8. /E must be HIGH during this period to ensure accurate default values in the configuration registers.
9. With output and I/O pins unloaded.
10. TEST1 and/or TEST2 may not be implemented on all versions of these products.
No
10
12
13
14
11
U nder T e st
1
2
3
4
5
6
7
8
9
T o D evice
ST
Figure 4: AC Test Load
Family
Symbol
t EHMFX
t EHMFV
t ELFFV
t RLRH
t EHQZ
t ELEH
t EHEL
t CVEL
t ELCX
t ELQX
t ELQV
t DVEL
t ELDX
t ELEL
R 2
SWITCHING TEST FIGURES COMPONENT VALUES
SWITCHING CHARACTERISTICS (see note 3)
Component
VCC
R1
R2
C1 (includes jig)
vcc
Parameter (all times in nanoseconds)
Chip Enable Compare Cycle Time
Chip Enable LOW Pulse Width
Chip Enable HIGH Pulse Width
Control Input to Chip Enable LOW Set-up Time
Control Input from Chip Enable LOW Hold Time
Chip Enable LOW to Outputs Active
Chip Enable LOW to Outputs Valid
Chip Enable HIGH to Outputs High-Z
Data to Chip Enable LOW Set-up Time
Data from Chip Enable LOW Hold Time
Chip Enable LOW to Full Flag Valid
Chip Enable HIGH to /MF Invalid
Chip Enable HIGH to /MF Valid
Reset LOW Pulse Width
R 1
C 1
SWITCHING TEST FIGURES
Test Load B
Test Load A
18
Medium Cycle:
Cycle Time
Short Cycle:
Long Cycle:
WA V E FO RM
5 0 % A M P L ITUDE
Figure 5: Input Signal Waveform
INP UT
Value
3.3
635
702
P O INT
30
5
0 V
100
100
Min
30
55
75
15
10
10
0
3
3
0
0
-10
Units
Volts
Ohms
Ohms
Max
pF
pF
1 0 n s
55
75
15
75
25
V IL (M IN)
Notes
4,6
4,6
4
4
4
5
5
6
7
8