CAT24WC01 Catalyst Semiconductor, CAT24WC01 Datasheet - Page 2

• Manufacturer Part Number: CAT24WC01
• Description: 1K/2K/4K/8K/16K-Bit Serial E2PROM
• Manufacturer: Catalyst Semiconductor

ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................. –55 C to +125 C
Storage Temperature ....................... –65 C to +150 C
Voltage on Any Pin with
V
Package Power Dissipation
Lead Soldering Temperature (10 secs) ............ 300 C
Output Short Circuit Current
RELIABILITY CHARACTERISTICS
D.C. OPERATING CHARACTERISTICS
V
CAPACITANCE T
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
(5) Standby Current (I
Doc. No. 25051-00 3/98 S-1
CC
CC
Symbol
Symbol
Symbol
N
T
V
I
LTH
voltage on output pins is V
Respect to Ground
Capability (Ta = 25 C) .................................. 1.0W
I
V
V
DR
ZAP
END
C
C
SB
with Respect to Ground ............... –2.0V to +7.0V
V
= +1.8V to +6.0V, unless otherwise specified.
I
I
V
I
CC
LO
OL1
OL2
I/O
IN
LI
IH
IL
(3)
(3)(4)
(5)
(3)
(3)
(3)
(3)
Input/Output Capacitance (SDA)
Input Capacitance (A0, A1, A2, SCL, WP)
Power Supply Current
Standby Current (V
Input Leakage Current
Output Leakage Current
Input Low Voltage
Input High Voltage
Output Low Voltage (V
Output Low Voltage (V
Endurance
Data Retention
ESD Susceptibility
Latch-up
SB
Parameter
A
) = 0 A (<900nA).
= 25 C, f = 1.0 MHz, V
(1)
Parameter
CC
........... –2.0V to +V
+0.5V, which may overshoot to V
(2)
........................ 100mA
Test
CC
= 5.0V)
CC
CC
1,000,000
= 3.0V)
= 1.8V)
2000
Min.
100
100
CC
CC
= 5V
+ 2.0V
V
CC
Min.
Max.
–1
x 0.7
CC
+ 2.0V for periods of less than 20ns.
2
Limits
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
Max.
Typ.
Cycles/Byte
8
6
Years
Units
Volts
mA
V
V
CC
CC
Max.
0.4
0.5
10
10
3
0
+ 0.5
x 0.3
Units
pF
pF
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
CC
Reference Test Method
+1V.
Units
mA
V
V
V
V
A
A
A
V
V
V
Test Conditions
OUT
Conditions
f
IN
IN
SCL
V
I
V
OL
I
= GND or V
= GND to V
I/O
OL
IN
= GND to V
= 100 KHz
= 1.5 mA
= 0V
= 0V
= 3 mA
CC
CC
CC