74VHC125 Fairchild Semiconductor, 74VHC125 Datasheet - Page 4

• Manufacturer Part Number: 74VHC125
• Description: Quad Buffer with 3-STATE Outputs
• Manufacturer: Fairchild Semiconductor

74VHC125
CAPACITIVE CHARACTERISTICS
1) C
Test Circuit).Average operting current can be obtained by the following equation. I
DYNAMIC SWITCHING CHARACTERISTICS
1) Worst case package.
2) Max number of outputs defined as (n). Data inputs are driven 0V to 5.0V, (n -1) outputs switching and one output at GND.
3) Max number of data inputs (n) switching. (n-1) switching 0V to5.0V. Inputs under test switching: 5.0V to threshold (V
TEST CIRCUIT
C
R
R
4/8
Symb ol
Symb ol
t
t
t
PLH
PZL
PZH
L
L
T
= 15/50 pF or equivalent (includes jig and probe capacitance)
= R
= Z
C
V
V
V
C
V
PD
C
OUT
OLP
OLV
IHD
, t
ILD
, t
PD
, t
IN
OUT
1
isdefined as the value of the IC’sinternal equivalent capacitance which is calculated fromthe operating current consumption without load. (Referto
PLZ
= 1K orequivalent
PHL
PHZ
of pulse generator (typically 50 )
Input Capacitance
Output Capacitance
Power Dissipation
Capacitance (note 1)
Dynamic Low Voltage
Quiet Output (note 1, 2)
Dynamic High Voltage
Input (note 1, 3)
Dynamic Low Voltage
Input (note 1, 3)
Parameter
Parameter
T EST
V
(V)
5.0
5.0
5.0
CC
T est Cond ition s
Test Co nditions
C
L
= 50 pF
CC
(opr) = C
Min.
-0.8
3.5
PD
Min.
T
V
CC
A
T
A
Typ .
= 25
-0.3
0.3
f
= 25
T yp.
IN
14
+ I
4
6
CC
o
C
/4(per circuit)
Value
o
Max.
C
Valu e
0.8
1.5
Max.
10
ILD
), 0V to threshold (V
SW IT CH
-40 to 85
Min .
-40 to 85
Min.
Open
GND
V
CC
Max.
Max.
10
o
o
C
C
IHD
), f=1MHz.
Un it
Un it
pF
pF
pF
V