MBM29F040C-55 FUJITSU [Fujitsu Component Limited.], MBM29F040C-55 Datasheet - Page 22

• Manufacturer Part Number: MBM29F040C-55
• Description: 4M (512K X 8) BIT
• Manufacturer: FUJITSU [Fujitsu Component Limited.]

22
•
Note: 1. Test Conditions:
MBM29F040C
t
t
t
t
t
t
t
JEDEC
AVAV
AVQV
ELQV
GLQV
EHQZ
GHQZ
AXQX
AC CHARACTERISTICS
Read Only Operations Characteristics
Parameter
Symbols
Output Load: 1 TTL gate and 30 pF
Input rise and fall times: 5 ns
Input pulse levels: 0.0 V to3.0 V
Timing measurement reference level
Input: 1.5 V
Output: 1.5 V
Note: 1.C
t
t
t
t
t
t
t
RC
ACC
CE
OE
DF
DF
OH
Standard
2.C
L
L
= 30 pF including jig capacitance
= 100 pF including jig capacitance
Read Cycle Time
Address to Output Delay
Chip Enable to Output Delay
Output Enable to Output Delay
Chip Enable to Output HIGH-Z
Output Enable to Output HIGH-Z
Output Hold Time From
Addresses,
CE or OE, Whichever Occurs First
Device
-55/-70/-90
Under
Test
Description
Figure 4
C
L
Test Conditions
IN3064
or Equivalent
CE = V
OE = V
OE = V
6.2 k
Note: 2. Test Conditions:
Test Setup
—
—
—
—
—
IL
IL
IL
Oput Load: 1 TTL gate and 100 pF
Input rise and fall times: 5 ns
Input pulse levels: 0.45 V to 2.4 V
Timing measurement reference level
5.0 V
Output: 0.8 and 2.0 V
Max.
Max.
Max.
Max.
Max.
Min.
Min.
Input: 0.8 and 2.0 V
2.7 k
(Note1)
-55
Diodes = IN3064
or Equivalent
55
55
55
30
20
20
0
(Note2)
-70
70
70
70
30
20
20
0
(Note2) Unit
-90
90
90
90
35
20
20
0
ns
ns
ns
ns
ns
ns
ns