PEB2447 SIEMENS [Siemens Semiconductor Group], PEB2447 Datasheet - Page 19

• Manufacturer Part Number: PEB2447
• Description: Memory Time Switch Extended Large MTSXL
• Manufacturer: SIEMENS [Siemens Semiconductor Group]

00xx
0011
01xx
10xx
Table 5
4 Bit Selftest Control Register
Bit
ST [0]
ST [1]
ST [2]
ST [3]
The extended TAP controller uses a modified data path:
Table 4
Data Path of 4 Bit TAP Controller
Instruction Code
11xx
When TAP_TEST1 / 2 is activated the data path is set to shift the result of the selftest
procedure (bit STAR:STOK) out through the TDO pin.
2.3.3
The built in self test is used by the following steps:
– The instruction TAP_TEST2 is shifted into the TAP controller (see figure 4)
– STP command is shifted into the selftest control register (see table 5 and figure 5)
– The instruction TAP_TEST1 is shifted into the TAP controller to start the selftest
– Bit STAR:STOK can be shifted out (see figure 7)
Note: ST [2:0] represent the bits CMDR:STP2..0 but do not overwrite them.
Semiconductor Group
(see figure 6) after 10240 TCK periods:
Use of Built in Selftest via the Boundary Scan Interface
Function
CMDR:STP0
CMDR:STP1
CMDR:STP2
“1” built in selftest
“0” no built in selftest
Input
TDI
BSOUT
BSOUT_ID
TDI2: STAR:STOK (internal)
TDI3: VSS (not used, internal)
19
.
Data Path
Functional Description
TDO
TDO
TDO
TDO
TDO
Output
PEB 2447
03.97