HT6256DB HONEYWELL [Honeywell Solid State Electronics Center], HT6256DB Datasheet - Page 6

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HT6256DB

Manufacturer Part Number
HT6256DB
Description
HIGH TEMPERATURE 32K x 8 STATIC RAM
Manufacturer
HONEYWELL [Honeywell Solid State Electronics Center]
Datasheet
HT6256
WRITE CYCLE AC TIMING CHARACTERISTICS (1)
(1) Test conditions: input switching levels VIL/VIH=0.5V/VDD-0.5V, input rise and fall times <1 ns/V, input and output timing reference levels
(2) Typical operating conditions: VDD=5.0 V, TA=25 C.
(3) Worst case operation conditions: VDD=4.5 V to 5.5 V, -55 to 225 C.
(4) TAVAVW = TWLWH + TWHWL
(5) Guaranteed but not tested.
(6) External control of Chip Enable (CE) is available only in other package options.
S
T
T
T
T
T
T
T
T
T
T
T
T
A
W
S
D
y
A
W
A
W
W
W
W
E
shown in the Tester AC Timing Characteristics table, capacitive output loading >50 pF, or equivalent capacitive load of 5 pF for TWLQZ.
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V
L
V
V
H
V
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A
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A
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W
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H
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X
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C
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A
A
W
W
W
C
DATA IN
ADDRESS
NWE
DATA OUT
NCS
a
CE
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IMPEDANCE
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AVWL
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WLQZ
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EHWH
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SLWH
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WLWH
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AVAVW
h t
e
(
) 5
T
DATA VALID
AVWH
T
DVWH
T
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p
c i
T
T
T
WHDX
a
WHQX
WHAX
( l
) 2
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M
5
4
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3
4
4
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5
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5
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5
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t s
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(
5
x
) 3
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