HCS166D INTERSIL [Intersil Corporation], HCS166D Datasheet - Page 6

• Manufacturer Part Number: HCS166D
• Description: Radiation Hardened 8-Bit Parallel-Input/Serial Output Shift Register
• Manufacturer: INTERSIL [Intersil Corporation]

NOTES:
NOTE:
NOTES:
1. Alternate Group A testing in accordance with Method 5005 of Mil-Std-883 may be exercised.
2. Table 5 parameters only.
1. Except FN test which will be performed 100% Go/No-Go.
1. Each pin except VCC and GND will have a resistor of 10K
2. Each pin except VCC and GND will have a resistor of 1K
Initial Test (Preburn-In)
Interim Test I (Postburn-In)
Interim Test II (Postburn-In)
PDA
Interim Test III (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Group D
Group E Subgroup 2
STATIC I BURN-IN (Note 1)
STATIC II BURN-IN (Note 1)
DYNAMIC BURN-IN (Note 2)
CONFORMANCE
OPEN
CONFORMANCE GROUPS
GROUPS
13
13
-
NOTE: Each pin except VCC and GND will have a resistor of 47K
Subgroup B-5
Subgroup B-6
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
2, 4, 6, 8, 10, 12
1 - 12, 14 - 15
OPEN
GROUND
13
METHOD
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
5005
8
TABLE 9. IRRADIATION TEST CONNECTIONS
Specifications HCS166MS
TABLE 7. TOTAL DOSE IRRADIATION
TABLE 6. APPLICABLE SUBGROUPS
Sample/5005
Sample/5005
Sample/5005
Sample/5005
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
METHOD
PRE RAD
1/2 VCC = 3V
1, 7, 9
GROUND
8
13
-
-
5% for dynamic burn-in
5% for static burn-in
255
TEST
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
0.5V
1, 2, 3, 7, 8A, 8B, 9, 10, 11
GROUP A SUBGROUPS
POST RAD
2, 3, 8A, 8B, 10, 11
Table 4
1, 7, 9, Deltas
1, 7, 9, Deltas
1 - 7, 9 - 12, 14 - 16
3, 5, 9, 11, 14 - 16
VCC = 6V
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9
1 - 7, 9 - 12, 14 - 16
VCC = 5V
16
5% for irradiation testing.
0.5V
PRE RAD
0.5V
1, 9
READ AND RECORD
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
ICC, IOL/H
Subgroups 1, 2, 3, 9, 10, 11,
(Note 2)
50kHz
READ AND RECORD
7
Spec Number
-
-
OSCILLATOR
Table 4 (Note 1)
POST RAD
25kHz
1
-
-
518758