MC9S08AW60 FREESCALE [Freescale Semiconductor, Inc], MC9S08AW60 Datasheet - Page 283
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MC9S08AW60
Manufacturer Part Number
MC9S08AW60
Description
Microcontrollers
Manufacturer
FREESCALE [Freescale Semiconductor, Inc]
Datasheet
1.MC9S08AW60.pdf
(324 pages)
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Appendix A
Electrical Characteristics and Timing Specifications
A.1
This section contains electrical and timing specifications.
A.2
The electrical parameters shown in this supplement are guaranteed by various methods. To give you a
better understanding, the following classification is used and the parameters are tagged accordingly in the
tables where appropriate:
A.3
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not
guaranteed. Stress beyond the limits specified in
permanent damage to the device. For functional operating conditions, refer to the remaining tables in this
section.
This device contains circuitry protecting against damage due to high static voltage or electrical fields;
however, it is advised that normal precautions be taken to avoid application of any voltages higher than
maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused
inputs are tied to an appropriate logic voltage level (for instance, either V
Freescale Semiconductor
C
D
P
T
Parameter Classification
Introduction
Absolute Maximum Ratings
Those parameters are guaranteed during production testing on each individual device.
Those parameters are achieved by the design characterization by measuring a statistically relevant
sample size across process variations.
Those parameters are achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted. All values shown in the typical column are within this
category.
Those parameters are derived mainly from simulations.
The classification is shown in the column labeled “C” in the parameter
tables where appropriate.
Table A-1. Parameter Classifications
MC9S08AW60 Data Sheet, Rev 2
Table A-2
NOTE
may affect device reliability or cause
SS
or V
DD
).
283