MC9S12E128 MOTOROLA [Motorola, Inc], MC9S12E128 Datasheet - Page 131

• Manufacturer Part Number: MC9S12E128
• Description: MC9S12E-Family Device User Guide V01.04
• Manufacturer: MOTOROLA [Motorola, Inc]

The failure rates for data retention and program/erase cycling are specified at <2ppm defects over lifetime
at the operating conditions noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
Conditions are shown in Table A-4 unless otherwise noted
Num
1
2
3
NOTE:
C
C
C
C
All values shown in Table B-6 are target values and subject to further extensive
characterization.
Data Retention at an average junction temperature of
T
Data Retention at a junction temperature of T
140°C
Flash number of Program/Erase cycles
Javg
= 85°C
Table B-6 NVM Reliability Characteristics
Freescale Semiconductor, Inc.
For More Information On This Product,
Rating
Go to: www.freescale.com
J
=
Device User Guide — 9S12E128DGV1/D V01.04
Symbol
t
t
NVMRET
NVMRET
n
FLPE
10,000
Min
15
10
Typ
Max
Cycles
Years
Years
Unit
131