TP30-100 STMicroelectronics, TP30-100 Datasheet - Page 4

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TP30-100

Manufacturer Part Number
TP30-100
Description
TRISILTM
Manufacturer
STMicroelectronics
Datasheet
TP30-xxx Series
TEST CIRCUIT 2 for I
4/6
TEST PROCEDURE :
This is a GO-NOGO Test which allows to confirm the holding current (I
test circuit.
V
2) Fire the D.U.T with a surge Current : Ipp = 10A , 10/1000 s.
3) The D.U.T will come back off-state within 50 ms max.
1) Adjust the current level at the I
BAT
= - 48 V
H
parameter.
R
H
value by short circuiting the AK of the D.U.T.
D.U.T.
Surge generator
H
) level in a functional
- V
P

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