HCTS20D/SAMPLE INTERSIL [Intersil Corporation], HCTS20D/SAMPLE Datasheet - Page 5
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HCTS20D/SAMPLE
Manufacturer Part Number
HCTS20D/SAMPLE
Description
Radiation Hardened Dual 4-Input NAND Gate
Manufacturer
INTERSIL [Intersil Corporation]
Datasheet
1.HCTS20DSAMPLE.pdf
(8 pages)
NOTES:
1. Each pin except VCC and GND will have a resistor of 10KΩ ± 5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 1KΩ ± 5% for dynamic burn-in
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
3, 6, 8, 11
3, 6, 8, 11
OPEN
-
NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing.
1, 2, 4, 5, 7, 9, 10, 12, 13
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
GROUND
3, 6, 8, 11
OPEN
7
7
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
TABLE 9. IRRADIATION TEST CONNECTIONS
Specifications HCTS20MS
1/2 VCC = 3V ± 0.5V
GROUND
3, 6, 8, 11
7
-
-
424
1, 2, 4, 5, 9, 10, 12,
VCC = 6V ± 0.5V
13, 14
1, 2, 4, 5, 9, 10, 12, 13, 14
14
14
VCC = 5V ± 0.5V
1, 2, 4, 5, 9, 10,
50kHz
12, 13
-
-
OSCILLATOR
Spec Number
25kHz
-
-
-
518619