MX29LV640D MCNIX [Macronix International], MX29LV640D Datasheet - Page 55

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MX29LV640D

Manufacturer Part Number
MX29LV640D
Description
64M-BIT [8M x 8/4M x 16] SINGLE VOLTAGE 3V
Manufacturer
MCNIX [Macronix International]
Datasheet

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TSOP PIN CAPACITANCE
ERASE AND PROGRAMMING PERFORMANCE
Notes:
1. Typical program and erase times assume the following conditions: 25° C, 3.0V VCC. Programming specifications
2. Maximum values are measured at VCC = 3.0 V, worst case temperature. Maximum values are valid up to and
3. Word/Byte programming specification is based upon a single word/byte programming operation not utilizing the
4. Erase/Program cycles comply with JEDEC JESD-47E & A117A standard.
P/N:PM1208
LATCH-UP CHARACTERISTICS
PARAMETER
Chip Erase Time
Sector Erase Time
Erase/Program Cycles
Chip Programming Time
Accelerated Byte/Word Program Time
Word Program Time
Byte Programming Time
Parameter Symbol
CIN2
COUT
CIN
Input Voltage voltage difference with GND on WP#/ACC, A9, OE, Reset# pins
Input Voltage voltage difference with GND on all normal pins input
Input Current Pulse
All pins included. Test conditions: Vcc = 3.0V, one pin per testing
assume checkboard data pattern.
including 100,000 program/erase cycles.
write buffer.
Parameter Description
Control Pin Capacitance
Output Capacitance
Input Capacitance
Byte Mode
Word Mode
55
MIN.
MX29LV640D T/B
Test Set
VIN=0
VOUT=0
VIN=0
100,000
LIMITS
TYP.
0.7
45
50
45
11
7
9
TYP
7.5
8.5
6
MAX.
-100mA
160
140
210
360
300
65
-1.0V
-1.0V
MIN.
2
MAX
7.5
12
9
REV. 1.6, AUG. 16, 2008
UNITS
Cycles
Vcc x 1.5V
sec
sec
sec
sec
+100mA
us
us
us
UNIT
11.5V
MAX.
pF
pF
pF

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