CY7C1515JV18-300BZI Cypress Semiconductor Corp, CY7C1515JV18-300BZI Datasheet - Page 22

• Manufacturer Part Number: CY7C1515JV18-300BZI
• Description: IC SRAM 72MBIT 300MHZ 165TFBGA
• Manufacturer: Cypress Semiconductor Corp

Specifications of CY7C1515JV18-300BZI

• Format - Memory: RAM
• Memory Type: SRAM - Synchronous, QDR II
• Memory Size: 72M (2M x 36)
• Speed: 300MHz
• Interface: Parallel
• Voltage - Supply: 1.7 V ~ 1.9 V
• Operating Temperature: -40°C ~ 85°C
• Package / Case: 165-TFBGA
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant

Capacitance
Tested initially and after any design or process change that may affect these parameters.
Thermal Resistance
Tested initially and after any design or process change that may affect these parameters.
AC Test Loads and Waveforms
Notes
Document Number: 001-12560 Rev. *C
C
C
C
Θ
Θ
21. Unless otherwise noted, test conditions are based on signal transition time of 2V/ns, timing reference levels of 0.75V, Vref = 0.75V, RQ = 250Ω, V
Parameter
Parameter
IN
CLK
O
JA
JC
pulse levels of 0.25V to 1.25V, and output loading of the specified I
OUTPUT
Device
Under
Test
V
REF
ZQ
Input Capacitance
Clock Input Capacitance
Output Capacitance
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
(a)
Z
RQ =
250Ω
0.75V
0
= 50Ω
Description
Description
V
REF
R
L
= 0.75V
= 50Ω
INCLUDING
T
Test conditions follow standard test methods and
procedures for measuring thermal impedance, in
accordance with EIA/JESD51.
Device
Under
Test
OUTPUT
A
JIG AND
SCOPE
= 25°C, f = 1 MHz, V
V
REF
ZQ
OL
/I
OH
and load capacitance shown in (a) of
0.75V
RQ =
250Ω
(b)
Test Conditions
Test Conditions
V
REF
= 0.75V
DD
R = 50Ω
5 pF
= 1.8V, V
CY7C1513JV18, CY7C1515JV18
CY7C1511JV18, CY7C1526JV18
0.25V
DDQ
= 1.5V
AC Test Loads and
1.25V
Slew Rate = 2 V/ns
ALL INPUT PULSES
0.75V
165 FBGA
Package
Max
16.2
Waveforms.
5.5
8.5
2.3
6
DDQ
[21]
Page 22 of 27
= 1.5V, input
°C/W
°C/W
Unit
Unit
pF
pF
pF
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