TLP3062(S,C,F,T) Toshiba, TLP3062(S,C,F,T) Datasheet - Page 60
![PHOTOCOUPLER ZC TRIAC OUT 6-DIP](/photos/7/73/77311/tlp3062_s_c_f_t__sml.jpg)
TLP3062(S,C,F,T)
Manufacturer Part Number
TLP3062(S,C,F,T)
Description
PHOTOCOUPLER ZC TRIAC OUT 6-DIP
Manufacturer
Toshiba
Specifications of TLP3062(S,C,F,T)
Voltage - Isolation
5000Vrms
Number Of Channels
1
Voltage - Off State
600V
Output Type
AC, Triac, Zero Cross
Current - Gate Trigger (igt) (max)
10mA
Current - Hold (ih)
600µA
Current - Dc Forward (if)
20mA
Current - Output / Channel
100mA
Mounting Type
Through Hole
Package / Case
6-DIP
Output Device
PhotoTriac
Isolation Voltage
5000 V
Peak Output Voltage (vdrm)
600 V
Maximum Input Voltage
240 VAC
Maximum Output Voltage
600 V
Minimum Trigger Current
5 mA
Configuration
1 Channel
Maximum Continuous Output Current
100 mA
Maximum Input Current
25 mA
Maximum Operating Temperature
+ 100 C
Maximum Power Dissipation
330 mW
Maximum Reverse Diode Voltage
5 V
Minimum Operating Temperature
- 40 C
Mounting Style
Through Hole
Zero-crossing Circuit
Yes
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Other names
TLP3062(S,F)
TLP3062SCFT
TLP3062SF
TLP3062SF
TLP3062SCFT
TLP3062SF
TLP3062SF
9
The above operating life data are estimates extrapolated from long-term light output degradation over a single wafer lot and are shown as
reference only. Operating conditions exceeding the maximum ratings are not guaranteed.
10000000
1
1
1000000
100000
10000
140
120
100
140
120
100
GaAs LED Projected Light Output Degradation Data
GaAs LED Projected Operating Life Data
1000
Device Degradation
80
60
40
20
80
60
40
20
100
0
0
1
1
227
2.0
I
I
I
I
I
150
F
F
F
F
F
Failure criteria light output degradation Δ P O < –50%
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
10
100
Test conditions: I
Test conditions: I
85
3.0
60
100
100
Test time (h)
Test time (h)
25
F
F
= 50 mA, Ta = 40°C
= 10 mA, Ta = 40°C
0
1000
1000
I
F
4.0
= 10 mA
I
I
I
I
–30
F
F
F
F
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Ambient Temperature (°C)
Projected F50%
operating life
Projected F0.1%
operating life
10000
10000
–50
X-3σ
X-3σ
1 / K (x10
X
X
–73
5.0
100000
100000
-3
)
60
10000000
1000000
100000
10000
140
120
100
1000
80
60
40
20
100
0
1
227
2.0
I
I
I
I
I
150
F
F
F
F
F
Failure criteria light output degradation Δ P O < –30%
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
10
100
Test conditions: I
85
3.0
60
100
Test time (h)
25
F
= 20 mA, Ta = 40°C
0
1000
4.0
I
I
I
I
I
F
F
F
F
F
–30
= 10 mA
= 20 mA
= 30 mA
= 40 mA
= 50 mA
Ambient Temperature (°C)
Projected F50%
operating life
Projected F0.1%
operating life
10000
–50
X-3σ
1 / K (x10
X
–73
5.0
100000
-3
)