ADUC7024BST62-REEL Analog Devices Inc, ADUC7024BST62-REEL Datasheet - Page 16

• Manufacturer Part Number: ADUC7024BST62-REEL
• Description: IC MCU FLASH 62K W/ANLG 64-LQFP
• Manufacturer: Analog Devices Inc
• Series: MicroConverter® ADuC7xxxr

Specifications of ADUC7024BST62-REEL

• Rohs Status: RoHS non-compliant
• Design Resources: Sensing Low-g Acceleration Using ADXL345 Digital Accelerometer Connected to ADuC7024 (CN0133)
• Core Processor: ARM7
• Core Size: 16/32-Bit
• Speed: 44MHz
• Connectivity: EBI/EMI, I²C, SPI, UART/USART
• Peripherals: PLA, PWM, PSM, Temp Sensor, WDT
• Number Of I /o: 30
• Program Memory Size: 62KB (62K x 8)
• Program Memory Type: FLASH
• Ram Size: 8K x 8
• Voltage - Supply (vcc/vdd): 2.7 V ~ 3.6 V
• Data Converters: A/D 10x12b; D/A 2x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 125°C
• Package / Case: 64-LQFP
• Eeprom Size: -
• Other names: ADUC7024BST62REEL

ADuC7019/20/21/22/24/25/26/27/28/29
ABSOLUTE MAXIMUM RATINGS
AGND = REFGND = DACGND = GND
otherwise noted.
Table 10.
Parameter
AV
AGND to DGND
IOV
Digital Input Voltage to IOGND
Digital Output Voltage to IOGND
V
Analog Inputs to AGND
Analog Outputs to AGND
Operating Temperature Range, Industrial
Storage Temperature Range
Junction Temperature
θ
Peak Solder Reflow Temperature
JA
REF
49-Ball CSP_BGA
SnPb Assemblies (10 sec to 30 sec)
RoHS Compliant Assemblies
40-Lead LFCSP
64-Lead LFCSP
64-Ball CSP_BGA
64-Lead LQFP
80-Lead LQFP
DD
Thermal Impedance
DD
to AGND
(20 sec to 40 sec)
to IOV
to IOGND, AV
DD
DD
to AGND
REF
Rating
−0.3 V to +0.3 V
−0.3 V to +0.3 V
−0.3 V to +6 V
−0.3 V to +5.3 V
−0.3 V to IOV
−0.3 V to AV
−0.3 V to AV
−0.3 V to AV
–40°C to +125°C
–65°C to +150°C
150°C
26°C/W
80°C/W
24°C/W
75°C/W
47°C/W
38°C/W
240°C
260°C
, T
A
= 25°C, unless
DD
DD
DD
DD
+ 0.3 V
+ 0.3 V
+ 0.3 V
+ 0.3 V
Rev. C | Page 16 of 96
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Only one absolute maximum rating can be applied at any one time.
ESD CAUTION