2MBI200U2A-060-50 FUJI ELECTRIC, 2MBI200U2A-060-50 Datasheet - Page 7

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2MBI200U2A-060-50

Manufacturer Part Number
2MBI200U2A-060-50
Description
DUAL IGBT MODULE 200A 600V NPT
Manufacturer
FUJI ELECTRIC
Datasheet

Specifications of 2MBI200U2A-060-50

Module Configuration
Dual
Transistor Polarity
N Channel
Dc Collector Current
200A
Collector Emitter Voltage Vces
2.45V
Power Dissipation Max
660W
Collector Emitter Voltage V(br)ceo
600V
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
2MBI200U2A-060-50
Manufacturer:
FUJITSU/富士通
Quantity:
20 000
Company:
Part Number:
2MBI200U2A-060-50
Quantity:
350
Test
cate-
gories
Electrical
Visual
Note : Each parameter measurement read-outs shall be made after stabilizing the components
characteristic
inspection
Item
at room ambient for 2 hours minimum, 24 hours maximum after removal from the tests.
at room ambient for 2 hours minimum, 24 hours maximum after removal from the tests.
And in case of the wetting tests, for example, moisture resistance tests, each component
And in case of the wetting tests, for example, moisture resistance tests, each component
shall be made wipe or dry completely before the measurement.
shall be made wipe or dry completely before the measurement.
1 High temperature
2 High temperature
3 Temperature
4 Intermitted
Each parameter measurement read-outs shall be made after stabilizing the components
Humidity Bias
(Power cycle)
( for IGBT )
Reverse Bias
Bias (for gate)
Operating Life
Test items
Leakage current
Gate threshold voltage VGE(th)
Saturation voltage
Forward voltage
Thermal
Isolation voltage
Visual inspection
resistance
Peeling
Plating
and the others
Characteristic
Test temp.
Bias Voltage
Bias Method
Test duration
Test temp.
Bias Voltage
Bias Method
Test duration
Test temp.
Relative humidity
Bias Voltage
Bias Method
Test duration
ON time
OFF time
Test temp.
Number of cycles
IGBT
FWD
Failure Criteria
VCE(sat)
or ∆ VCE
Symbol
Test methods and conditions
±IGES
∆ VGE
ICES
∆ VF
Viso
Reliability Test Items
VF
-
: VC = 0.8×VCES
: Applied DC voltage to C-E
: 1000hr.
: VC = VGE = +20V or -20V
: Applied DC voltage to G-E
: 1000hr.
: 85 5%
: VC = 0.8×VCES
: Applied DC voltage to C-E
: 1000hr.
: ∆ Tj=100±5 deg
: Ta = 125 5
: Ta = 125 5
: 85 2
: 2 sec.
: 18 sec.
: 15000 cycles
Lower limit Upper limit
VGE = 0V
VCE = 0V
VGE = 0V
Tj
LSL×0.8
The visual sample
(Tj
(Tj
Broken insulation
Failure criteria
-
-
-
-
-
-
150
o
C
150
150
, Ta=25±5
LSL : Lower specified limit.
USL : Upper specified limit.
USL×1.2
USL×1.2
USL×1.2
USL×1.2
USL×1.2
USL×2
USL×2
)
)
MS5F 5616
Unit
mA
mA
mV
mV
µA
V
V
-
-
(Aug.-2001 edition)
Condition code C
Test Method 101
Test Method 101
Test Method 102
Test Method 106
EIAJ ED-4701
Reference
norms
Note
Number
sample
H04-004-03a
of
5
5
5
5
7
13
Accept-
ance
number
( 0 : 1 )
( 0 : 1 )
( 0 : 1 )
( 0 : 1 )
a

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