ATF-38143-TR1 Avago Technologies US Inc., ATF-38143-TR1 Datasheet - Page 2

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ATF-38143-TR1

Manufacturer Part Number
ATF-38143-TR1
Description
TRANSISTOR,HEMT,N-CHAN,4.5V V(BR)DSS,90mA I(DSS),SOT-343R
Manufacturer
Avago Technologies US Inc.
Datasheet

Specifications of ATF-38143-TR1

Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant

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Part Number
Manufacturer
Quantity
Price
Part Number:
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Manufacturer:
AVAGO
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Part Number:
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Manufacturer:
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Quantity:
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ATF-38143 Absolute Maximum Ratings
Note:
Distribution data sample size is 450
samples taken from 6 different wafers.
Future wafers allocated to this product
may have nominal values anywhere within
the upper and lower spec limits.
Product Consistency Distribution Charts
Figure 1. Typical I-V Curves.
(V
250
200
150
100
180
150
120
Symbol
Figure 3. NF @ 2 GHz, 2 V, 10 mA.
LSL=0, Nominal=0.44, USL=0.85
50
90
60
30
P
GS
0
0
P
T
V
V
in max
T
0.1
V
I
θ
0
= -0.2 V per step)
diss
STG
DS
GD
DS
GS
CH
jc
0.2
1
-3 Std
0.3
Drain - Source Voltage
Gate - Source Voltage
Gate Drain Voltage
Drain Current
Total Power Dissipation
RF Input Power
Channel Temperature
Storage Temperature
Thermal Resistance
0.4 0.5
2
V
NF (dB)
DS
(V)
+3 Std
3
0.6
Parameter
+0.6 V
–0.6 V
0 V
0.7 0.8
4
0.9
5
[3]
Cpk = 4.08938
Stdev = 0.03 dB
6 Wafers
Sample Size = 450
[2]
[2]
Measurements made on production test
board. This circuit represents a trade-off
between an optimal noise match and a
realizeable match based on production test
requirements. Circuit losses have been de-
embedded from actual measurements.
[1]
°C/W
Units
dBm
mW
mA
°C
°C
V
V
V
300
250
200
150
100
160
120
Figure 2. OIP3 @ 2 GHz, 2 V, 10 mA.
LSL=18.5, Nominal=21.99, USL=26.0
Figure 4. Gain @ 2 GHz, 2 V, 10 mA.
LSL=15.0, Nominal=16.06, USL= 18.0
50
80
40
0
0
18
15
15.5
-3 Std
-3 Std
Maximum
-65 to 160
Absolute
20
580
160
165
I
4.5
17
-4
-4
dss
16
GAIN (dB)
OIP3 (dB)
+3 Std
16.5
22
17
+3 Std
24
Notes:
1. Operation of this device above any one
2. Source lead temperature is 25°C.
3. Thermal resistance measured using
17.5
of these parameters may cause
permanent damage.
Derate 6 mW/°C for T
150°C Liquid Crystal Measurement
method.
2
26
18
Cpk = 2.58097
Stdev = 0.14 dB
6 Wafers
Sample Size = 450
Cpk = 1.59062
Stdev = 0.73 dBm
6 Wafers
Sample Size = 450
L
> 64°C.

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