ICS932S401EFT IDT, Integrated Device Technology Inc, ICS932S401EFT Datasheet - Page 20

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ICS932S401EFT

Manufacturer Part Number
ICS932S401EFT
Description
IC TIMING CTRL HUB PROGR 56-SSOP
Manufacturer
IDT, Integrated Device Technology Inc
Type
Timing Control Hubr
Datasheet

Specifications of ICS932S401EFT

Input
Crystal
Output
Clock
Frequency - Max
400MHz
Voltage - Supply
3.135 V ~ 3.465 V
Operating Temperature
0°C ~ 70°C
Mounting Type
Surface Mount
Package / Case
56-SSOP
Frequency-max
400MHz
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Other names
932S401EFT
PD De-assertion
The time from the de-assertion of PD or until power supply ramps to get stable clocks will be less than 1.8ms. If the drive
mode control bit for PD tristate is programmed to '1' the stopped differential pair must first be driven high to a minimum of
200mV in less than 300 s of PD deassertion.
0921G—08/24/09
Com m ents
Power-up w/ TEST_SEL = 1 to enter test mode
Cycle power to disable test mode
FS_C./TEST_SEL -->3-level latched input
If power-up w/ V>2.0V (-0.3V) then use TEST_SEL
If power-up w/ V<2.0V (-0.3V) then use FS_C
FS_B/TEST_MODE -->low Vth input
TEST_MODE is a
If TEST_SEL HW pin is 0 during power-up,
test mode can be invoked through B6b6.
If test mode is invoked by B6b6, only B6b7
is used to select HI-Z or REF/N
FS_B/TEST_Mode pin is not used.
Cycle power to disable test mode, one shot control
B6b6: 1= ENTER TEST MODE, Default = 0 (NORMAL OPERATION)
B6b7: 1= REF/N, Default = 0 (HI-Z)
Test Clarification Table
Integrated
Circuit
Systems, Inc.
CPU#, 133MHz
SRC# 100MHz
REF, 14.31818
CPU, 133MHz
SRC, 100MHz
USB, 48MHz
PCI, 33MHz
PWRDWN#
<1.8mS
Tstable
<300µS, >200mV
Tdrive_PwrDwn#
20
FS_C/TEST
HW PIN
_SEL
0
1
1
1
1
0
0
HW
FS_B/TEST
HW PIN
_MO DE
X
X
X
0
0
1
1
ENTRY
TEST
B6b6
BIT
X
X
X
X
0
1
1
SW
REF/N or
B6b7
HI-Z
X
ICS932S401
0
1
0
1
0
1
NORMAL
OUTPUT
REF/N
REF/N
REF/N
REF/N
HI-Z
HI-Z

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