EPM7256AETI144-7N Altera, EPM7256AETI144-7N Datasheet - Page 18

IC MAX 7000 CPLD 256 144-TQFP

EPM7256AETI144-7N

Manufacturer Part Number
EPM7256AETI144-7N
Description
IC MAX 7000 CPLD 256 144-TQFP
Manufacturer
Altera
Series
MAX® 7000Ar
Datasheet

Specifications of EPM7256AETI144-7N

Programmable Type
In System Programmable
Delay Time Tpd(1) Max
7.5ns
Voltage Supply - Internal
3 V ~ 3.6 V
Number Of Logic Elements/blocks
16
Number Of Macrocells
256
Number Of Gates
5000
Number Of I /o
120
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
144-TQFP, 144-VQFP
Voltage
3.3V
Memory Type
EEPROM
Number Of Logic Elements/cells
16
Family Name
MAX 7000A
# Macrocells
256
Number Of Usable Gates
5000
Frequency (max)
166.67MHz
Propagation Delay Time
7.5ns
Number Of Logic Blocks/elements
16
# I/os (max)
120
Operating Supply Voltage (typ)
3.3V
In System Programmable
Yes
Operating Supply Voltage (min)
3V
Operating Supply Voltage (max)
3.6V
Operating Temp Range
-40C to 85C
Operating Temperature Classification
Industrial
Mounting
Surface Mount
Pin Count
144
Package Type
TQFP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Features
-
Lead Free Status / Rohs Status
Compliant
Other names
544-2063
EPM7256AETI144-7N

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MAX 7000A Programmable Logic Device Data Sheet
18
Programming Times
The time required to implement each of the six programming stages can
be broken into the following two elements:
By combining the pulse and shift times for each of the programming
stages, the program or verify time can be derived as a function of the TCK
frequency, the number of devices, and specific target device(s). Because
different ISP-capable devices have a different number of EEPROM cells,
both the total fixed and total variable times are unique for a single device.
Programming a Single MAX 7000A Device
The time required to program a single MAX 7000A device in-system can
be calculated from the following formula:
where: t
The ISP times for a stand-alone verification of a single MAX 7000A device
can be calculated from the following formula:
where: t
t
t
PROG
VER
A pulse time to erase, program, or read the EEPROM cells.
A shifting time based on the test clock (TCK) frequency and the
number of TCK cycles to shift instructions, address, and data into the
device.
=
=
t
VPULSE
t
Cycle
f
t
Cycle
TCK
t
PROG
PPULSE
VER
VPULSE
PPULSE
PTCK
VTCK
+
+
Cycle VTCK
--------------------------------
Cycle
------------------------------- -
= Programming time
= Sum of the fixed times to erase, program, and
= Number of TCK cycles to program a device
= TCK frequency
f TCK
= Verify time
= Sum of the fixed times to verify the EEPROM cells
= Number of TCK cycles to verify a device
f
TCK
verify the EEPROM cells
PTCK
Altera Corporation

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