EP1S20F484I6 Altera, EP1S20F484I6 Datasheet - Page 155

• Manufacturer Part Number: EP1S20F484I6
• Description: IC STRATIX FPGA 20K LE 484-FBGA
• Manufacturer: Altera
• Series: Stratix®r

Specifications of EP1S20F484I6

• Number Of Logic Elements/cells: 18460
• Number Of Labs/clbs: 1846
• Total Ram Bits: 1669248
• Number Of I /o: 361
• Voltage - Supply: 1.425 V ~ 1.575 V
• Mounting Type: Surface Mount
• Operating Temperature: -40°C ~ 100°C
• Package / Case: 484-FBGA
• Family Name: Stratix
• Number Of Logic Blocks/elements: 18460
• # I/os (max): 361
• Frequency (max): 450.05MHz
• Process Technology: 0.13um (CMOS)
• Operating Supply Voltage (typ): 1.5V
• Logic Cells: 18460
• Ram Bits: 1669248
• Operating Supply Voltage (min): 1.425V
• Operating Supply Voltage (max): 1.575V
• Operating Temp Range: -40C to 100C
• Operating Temperature Classification: Industrial
• Mounting: Surface Mount
• Pin Count: 484
• Package Type: FC-FBGA
• Lead Free Status / RoHS Status: Contains lead / RoHS non-compliant
• Number Of Gates: -
• Lead Free Status / Rohs Status: Not Compliant
• Other names: 544-2086

IEEE Std. 1149.1
(JTAG)
Boundary-Scan
Support
Altera Corporation
July 2005
S51003-1.3
All Stratix
IEEE Std. 1149.1a-1990 specification. JTAG boundary-scan testing can be
performed either before or after, but not during configuration. Stratix
devices can also use the JTAG port for configuration together with either
the Quartus
Byte-Code Files (.jbc).
Stratix devices support IOE I/O standard setting reconfiguration through
the JTAG BST chain. The JTAG chain can update the I/O standard for all
input and output pins any time before or during user mode through the
CONFIG_IO instruction. You can use this ability for JTAG testing before
configuration when some of the Stratix pins drive or receive from other
devices on the board using voltage-referenced standards. Since the Stratix
device may not be configured before JTAG testing, the I/O pins may not
be configured for appropriate electrical standards for chip-to-chip
communication. Programming those I/O standards via JTAG allows you
to fully test the I/O connection to other devices.
The enhanced PLL reconfiguration bits are part of the JTAG chain before
configuration and after power-up. After device configuration, the PLL
reconfiguration bits are not part of the JTAG chain.
The JTAG pins support 1.5-V/1.8-V or 2.5-V/3.3-V I/O standards. The
TDO pin voltage is determined by the V
The VCCSEL pin selects whether the JTAG inputs are 1.5-V, 1.8-V, 2.5-V, or
3.3-V compatible.
Stratix devices also use the JTAG port to monitor the logic operation of the
device with the SignalTap
support the JTAG instructions shown in
The Quartus II software has an Auto Usercode feature where you can
choose to use the checksum value of a programming file as the JTAG user
code. If selected, the checksum is automatically loaded to the USERCODE
register. In the Settings dialog box in the Assignments menu, click Device
& Pin Options, then General, and then turn on the Auto Usercode
option.
®
®
devices provide JTAG BST circuitry that complies with the
II software or hardware using either Jam Files (.jam) or Jam
3. Configuration & Testing
®
II embedded logic analyzer. Stratix devices
CCIO
Table
of the bank where it resides.
3–1.
3–1