MPC859TZP100A Freescale Semiconductor, MPC859TZP100A Datasheet - Page 14

IC MPU POWERQUICC 100MHZ 357PBGA

MPC859TZP100A

Manufacturer Part Number
MPC859TZP100A
Description
IC MPU POWERQUICC 100MHZ 357PBGA
Manufacturer
Freescale Semiconductor
Datasheet

Specifications of MPC859TZP100A

Processor Type
MPC8xx PowerQUICC 32-Bit
Speed
100MHz
Voltage
1.8V
Mounting Type
Surface Mount
Package / Case
357-PBGA
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Features
-

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MPC859TZP100A
Manufacturer:
MOT
Quantity:
12 388
Part Number:
MPC859TZP100A
Manufacturer:
MOTOLOLA
Quantity:
885
Part Number:
MPC859TZP100A
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
Thermal Calculation and Measurement
7.5
To determine the junction temperature of the device in the application after prototypes are available, the thermal
characterization parameter (Ψ
temperature at the top center of the package case using the following equation:
where:
The thermal characterization parameter is measured per JESD51-2 specification published by JEDEC using a 40
gauge type T thermocouple epoxied to the top center of the package case. The thermocouple should be positioned
so that the thermocouple junction rests on the package. A small amount of epoxy is placed over the thermocouple
junction and over about 1 mm of wire extending from the junction. The thermocouple wire is placed flat against the
package case to avoid measurement errors caused by cooling effects of the thermocouple wire.
7.6
Semiconductor Equipment and Materials International(415) 964-5111
805 East Middlefield Rd.
Mountain View, CA 94043
MIL-SPEC and EIA/JESD (JEDEC) specifications800-854-7179 or
(Available from Global Engineering Documents)303-397-7956
JEDEC Specifications http://www.jedec.org
1. C.E. Triplett and B. Joiner, “An Experimental Characterization of a 272 PBGA Within an Automotive Engine
Controller Module,” Proceedings of SemiTherm, San Diego, 1998, pp. 47-54.
2. B. Joiner and V. Adams, “Measurement and Simulation of Junction to Board Thermal Resistance and Its
Application in Thermal Modeling,” Proceedings of SemiTherm, San Diego, 1999, pp. 212-220.
14
T
Experimental Determination
References
J
= T
Ψ
T
P
D
T
JT
T
= thermocouple temperature on top of package
= power dissipation in package
+(Ψ
= thermal characterization parameter
JT
x P
D
)
JT
) can be used to determine the junction temperature with a measurement of the
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor

Related parts for MPC859TZP100A