MT46V16M16BG-5B Micron Semiconductor Products, MT46V16M16BG-5B Datasheet

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MT46V16M16BG-5B

Manufacturer Part Number
MT46V16M16BG-5B
Description
Manufacturer
Micron Semiconductor Products
Datasheet

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MT46V16M16BG-5B:F TR
Manufacturer:
Micron Technology Inc
Quantity:
10 000
Double Data Rate (DDR) SDRAM
MT46V64M4 – 16 Meg x 4 x 4 banks
MT46V32M8 – 8 Meg x 8 x 4 banks
MT46V16M16 – 4 Meg x 16 x 4 banks
Features
• V
• V
• Bidirectional data strobe (DQS) transmitted/
• Internal, pipelined double-data-rate (DDR)
• Differential clock inputs (CK and CK#)
• Commands entered on each positive CK edge
• DQS edge-aligned with data for READs; center-
• DLL to align DQ and DQS transitions with CK
• Four internal banks for concurrent operation
• Data mask (DM) for masking write data
• Programmable burst lengths (BL): 2, 4, or 8
• Auto refresh and self refresh modes
• Longer-lead TSOP for improved reliability (OCPL)
• 2.5V I/O (SSTL_2-compatible)
• Concurrent auto precharge option supported
PDF: 09005aef80768abb/Source: 09005aef80768abb
256Mb_DDR_x4x8x16_D1.fm - 256Mb DDR: Rev. N, Core DDR: Rev. B 5/08 EN
received with data, that is, source-synchronous data
capture (x16 has two – one per byte)
architecture; two data accesses per clock cycle
aligned with data for WRITEs
(x16 has two – one per byte)
t
RAS lockout supported (
DD
DD
= +2.5V ±0.2V, V
= +2.6V ±0.1V, V
Products and specifications discussed herein are subject to change by Micron without notice.
DD
DD
Q = +2.5V ±0.2V
Q = +2.6V ±0.1V (DDR400)
t
RAP =
t
RCD)
1
Notes: 1. Only available on Revision F and G.
Options
• Configuration
• Plastic package – OCPL
• Plastic package
• Timing – cycle time
• Self refresh
• Temperature rating
• Revision
– 64 Meg x 4 (16 Meg x 4 x 4 banks)
– 32 Meg x 8 (8 Meg x 8 x 4 banks)
– 16 Meg x 16 (4 Meg x 16 x 4 banks)
– 66-pin TSOP
– 66-pin TSOP (Pb-free)
– 60-ball FBGA (8mm x 14mm)
– 60-ball FBGA (8mm x 14mm) (Pb-free)
– 60-ball FBGA (8mm x 12.5mm)
– 60-ball FBGA (8mm x 12.5mm)
– 5ns @ CL = 3 (DDR400B)
– 6ns @ CL = 2.5 (DDR333) FBGA only
– 6ns @ CL = 2.5 (DDR333) TSOP only
– 7.5ns @ CL = 2 (DDR266)
– 7.5ns @ CL = 2 (DDR266A)
– 7.5ns @ CL = 2.5 (DDR266B)
– Standard
– Low-power self refresh
– Commercial (0°C to +70°C)
– Industrial (–40°C to +85°C)
– x4, x8
– x16
– x4, x8, x16
(Pb-free)
Micron Technology, Inc., reserves the right to change products or specifications without notice.
2. Only available on Revision K.
3. Not recommended for new designs.
256Mb: x4, x8, x16 DDR SDRAM
©2003 Micron Technology, Inc. All rights reserved.
Marking
Features
16M16
64M4
32M8
-75E
-75Z
None
None
BG
-75
FG
CV
CY
-5B
-6T
TG
:G
:F
IT
-6
:K
P
L
3
3
2
1
1
2
1
1
1

Related parts for MT46V16M16BG-5B

MT46V16M16BG-5B Summary of contents

Page 1

Double Data Rate (DDR) SDRAM MT46V64M4 – 16 Meg banks MT46V32M8 – 8 Meg banks MT46V16M16 – 4 Meg banks Features • +2.5V ±0.2V ...

Page 2

Table 1: Key Timing Parameters CL = CAS (READ) latency; MIN clock rate with 50% duty cycle (-75E, -75Z 2.5 (-6, -6T, -75), and (-5B) Clock Rate (MHz) Speed Grade CL ...

Page 3

Figure 1: 256Mb DDR SDRAM Part Numbers MT46V Configuration FBGA Part Marking System Due to space limitations, FBGA-packaged components have an abbreviated part marking that is different from the part number. For a quick conversion of an FBGA code, see ...

Page 4

Table of Contents State Diagram ...

Page 5

State Diagram Figure 2: Simplified State Diagram Power applied Note: This diagram represents operations within a single bank only and does not capture concur- rent operations in other banks. PDF: 09005aef80768abb/Source: 09005aef80768abb DDR_x4x8x16_Core1.fm - 256Mb DDR: Rev. N, Core DDR: ...

Page 6

Functional Description The DDR SDRAM uses a double data rate architecture to achieve high-speed operation. The double data rate architecture is essentially a 2n-prefetch architecture with an inter- face designed to transfer two data words per clock cycle at the ...

Page 7

Functional Block Diagrams The 256Mb DDR SDRAM is a high-speed CMOS, dynamic random-access memory containing 268,435,456 bits internally configured as a 4-bank DRAM. Figure 3: 64 Meg x 4 Functional Block Diagram CKE CK# CK Control CS# logic ...

Page 8

Figure 4: 32 Meg x 8 Functional Block Diagram CKE CK# CK CONTROL CS# LOGIC WE# CAS# RAS# REFRESH COUNTER MODE REGISTERS 15 13 A0–A12, ADDRESS 15 BA0, BA1 REGISTER 2 10 Figure 5: 16 Meg x 16 Functional Block ...

Page 9

Pin and Ball Assignments and Descriptions Figure 6: 66-Pin TSOP Pin Assignments (Top View DQ0 DQ1 ...

Page 10

Figure 7: 60-Ball FBGA Ball Assignments (Top View REF REF DQ14 DQ12 DQ10 DQ8 V REF PDF: 09005aef80768abb/Source: ...

Page 11

Table 4: Pin and Ball Descriptions FBGA TSOP Numbers Numbers Symbol K7, L8, L7, 29, 30, 31, A0, A1, A2, M8, M2, L3, 32, 35, 36, A3, A4, A5, L2, K3, K2, 37, 38, 39, A6, A7, A8, J3, K8, ...

Page 12

Table 4: Pin and Ball Descriptions (continued) FBGA TSOP Numbers Numbers Symbol B7, D7, D3, 5, 11, 56, DQ0–DQ2 B3 62 DQ3 E3 51 DQS E7 16 LDQS E3 51 UDQS F8 B2, D2, ...

Page 13

Package Dimensions Figure 8: 66-Pin Plastic TSOP (400 mil) 22.22 ± 0.08 0.65 TYP 0.32 ±0.075 TYP PIN #1 ID Notes: 1. All dimensions in millimeters. 2. Package width and length do not include mold protrusion; allowable mold protrusion is ...

Page 14

Figure 9: 60-Ball FBGA (8mm x 14mm) Seating plane A 0.12 A 60X Ø0.45 Solder ball material: SAC305. Dimensions apply solder balls post- reflow on Ø0.33 NSMD ball pads. 11 CTR 1 TYP Notes: 1. Package ...

Page 15

Figure 10: 60-Ball FBGA (8mm x 12.5mm) Seating plane A 0.12 A 60X Ø0.45 Solder ball material: eutectic or SAC305. Dimensions apply to solder balls post- reflow on Ø0. NSMD ball pads. 11 CTR 1 TYP Notes: ...

Page 16

Electrical Specifications – I Table 6: I Specifications and Conditions (x4, x8: -5B, -6, -6T, -75E, -7Z, -75) - Die Revision F Only +2.6V ±0.1V 0°C ≤ T ≤ +70°C; Notes: 1–5, 11, 13, ...

Page 17

Table 7: I Specifications and Conditions (x16: -5B, -6, -6T, -75E, -75Z, -75) - Die Revision G Only +2.6V ±0.1V 0°C ≤ T ≤ +70°C; Notes: 1–5, 11, 13, 15, 47; Notes appear on ...

Page 18

Table 8: I Specifications and Conditions (x4, x8, x16: -5B, -6, -6T) - Die Revision K Only +2.6V ±0.1V 0°C ≤ T ≤ +70°C; Notes: 1–5, 11, 13, 15, 47; Notes appear on pages ...

Page 19

Table 9: I Test Cycle Times DD Values reflect number of clock cycles for each test Speed Clock I Test Grade Cycle Time -75/75Z 7.5ns DD -75E 7.5ns -6/-6T 6ns -5B 5ns I 1 -75 7.5ns DD ...

Page 20

Electrical Specifications – DC and AC Stresses greater than those listed in Table 10 may cause permanent damage to the device. This is a stress rating only, and functional operation of the device at these or any other conditions above ...

Page 21

Table 12: DC Electrical Characteristics and Operating Conditions (-6, -6T, -75E, -75Z, -75) Notes: 1–5, 17 apply to the entire table; Notes appear on page 37; V Parameter/Condition Supply voltage I/O supply voltage I/O reference voltage I/O termination voltage (system) ...

Page 22

Figure 11: Input Voltage Waveform Transmitter Notes Numbers in diagram reflect nominal values utilizing circuit below for all devices other than -5B. PDF: 09005aef80768abb/Source: 09005aef80768abb DDR_x4x8x16_Core2.fm - 256Mb DDR: Rev. N, Core DDR: ...

Page 23

Table 14: Clock Input Operating Conditions Notes: 1–5, 16, 17, 31 apply to the entire table; Notes appear on page 37; 0°C ≤ T ≤ +70° Parameter/Condition Clock input mid-point voltage: CK and CK# Clock input voltage ...

Page 24

Table 15: Capacitance (x4, x8 TSOP) Note: 14 applies to the entire table; Notes appear on page 37 Parameter Delta input/output capacitance: DQ0–DQ3 (x4), DQ0–DQ7 (x8) Delta input capacitance: Command and address Delta input capacitance: CK, CK# Input/output capacitance: DQ, ...

Page 25

Table 19: Electrical Characteristics and Recommended AC Operating Conditions (-5B) Notes 1–6, 16–18, 34 apply to the entire table; Notes appear on page 37; 0°C ≤ T ≤ +70° Characteristics Parameter Access window of DQ from ...

Page 26

Table 19: Electrical Characteristics and Recommended AC Operating Conditions (-5B) (continued) Notes 1–6, 16–18, 34 apply to the entire table; Notes appear on page 37; 0°C ≤ T ≤ +70° Characteristics Parameter Internal WRITE-to-READ command delay ...

Page 27

Table 20: Electrical Characteristics and Recommended AC Operating Conditions (-6) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 37; 0°C ≤ T ≤ +70° Characteristics Parameter Access window of DQ from ...

Page 28

Table 20: Electrical Characteristics and Recommended AC Operating Conditions (-6) (continued) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 37; 0°C ≤ T ≤ +70° Characteristics Parameter DQS write postamble Write ...

Page 29

Table 21: Electrical Characteristics and Recommended AC Operating Conditions (-6T) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 37; 0°C ≤ T ≤ +70° Characteristics Parameter Access window of DQ from ...

Page 30

Table 21: Electrical Characteristics and Recommended AC Operating Conditions (-6T) (continued) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 37; 0°C ≤ T ≤ +70° Characteristics Parameter DQS write postamble Write ...

Page 31

Table 22: Electrical Characteristics and Recommended AC Operating Conditions (-75E) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 37; 0°C ≤ T ≤ +70° Characteristics Parameter Access window of DQ from ...

Page 32

Table 22: Electrical Characteristics and Recommended AC Operating Conditions (-75E) (continued) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 37; 0°C ≤ T ≤ +70° Characteristics Parameter DQS write postamble Write ...

Page 33

Table 23: Electrical Characteristics and Recommended AC Operating Conditions (-75Z) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 37; 0°C ≤ T ≤ +70° Characteristics Parameter Access window of DQ from ...

Page 34

Table 23: Electrical Characteristics and Recommended AC Operating Conditions (-75Z) (continued) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 37; 0°C ≤ T ≤ +70° Characteristics Parameter Write recovery time Internal ...

Page 35

Table 24: Electrical Characteristics and Recommended AC Operating Conditions (-75) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 37; 0°C ≤ T ≤ +70° Characteristics Parameter Access window of DQ from ...

Page 36

Table 24: Electrical Characteristics and Recommended AC Operating Conditions (-75) (continued) Notes: 1–6, 16–18, 34 apply to the entire table; Notes appear on page 37; 0°C ≤ T ≤ +70° Characteristics Parameter Write recovery time Internal ...

Page 37

Notes 1. All voltages referenced Tests for AC timing nominal reference/supply voltage levels, but the related specifications and the device operation are guaranteed for the full voltage range specified. 3. Outputs (except for I Output ...

Page 38

The CK/CK# input reference level (for timing referenced to CK/CK#) is the point at which CK and CK# cross; the input reference level for signals other than CK/CK REF 17. Inputs are not recognized as valid until ...

Page 39

The input capacitance per pin group will not differ by more than this maximum amount for any given device. 31. CK and CK# input slew rate must be ≥1 V/ns (≥2 V/ns if measured differentially). Figure 13: Derating Data ...

Page 40

The full driver pull-up current variation from MIN to MAX process; temperature 38d. The driver pull-up current variation within nominal limits of voltage and temper- 38e. The full ratio variation of MAX to MIN pull-up and pull-down current should ...

Page 41

The driver pull-up current variation, within nominal voltage and temperature 39e. The full ratio variation of the MAX-to-MIN pull-up and pull-down current should 39f. The full ratio variation of the nominal pull-up to pull-down current should be Figure 16: ...

Page 42

RPST end point and but specify when the device output is no longer driving ( t ( RPRE). 45. During initialization, V Alternatively, V 0V, provided a minimum of 42Ω of series resistance is used between the V ...

Page 43

Table 27: Normal Output Drive Characteristics Characteristics are specified under best, worst, and nominal process variation/conditions Pull-Down Current (mA) Voltage Nominal Nominal (V) Low High 0.1 6.0 6.8 0.2 12.2 13.5 0.3 18.1 20.1 0.4 24.1 26.6 0.5 29.8 33.0 ...

Page 44

Table 28: Reduced Output Drive Characteristics Characteristics are specified under best, worst, and nominal process variation/conditions Pull-Down Current (mA) Voltage Nominal Nominal (V) Low High 0.1 3.4 3.8 0.2 6.9 7.6 0.3 10.3 11.4 0.4 13.6 15.1 0.5 16.9 18.7 ...

Page 45

Commands Tables 29 and 30 provide a quick reference of available commands. Two additional Truth Tables—Table 31 on page 46 and Table 32 on page 47—provide current state/next state information. Table 29: Truth Table 1 – Commands CKE is HIGH ...

Page 46

Table 31: Truth Table 3 – Current State Bank n – Command to Bank n Notes: 1–6 apply to the entire table; Notes appear below Current State CS# RAS# CAS# Any Idle L L Row active L ...

Page 47

Refreshing: Starts with registration of an AUTO REFRESH command and ends when • Accessing mode register: Starts with registration of an LMR command and ends when • Precharging all: Starts with registration of a PRECHARGE ALL command and ends ...

Page 48

This table describes alternate bank operation, except where noted (that is, the current state is for bank n, and the commands shown are those allowed to be issued to bank m, assuming that bank such a ...

Page 49

Table 34: Truth Table 5 – CKE Notes 1–6 apply to the entire table; Notes appear below CKE CKE Current State n Power-down Self refresh L H Power-down Self refresh H L All banks idle Bank(s) active ...

Page 50

ACTIVE (ACT) The ACTIVE command is used to open (or activate) a row in a particular bank for a subsequent access, like a read or a write, as shown in Figure 18. The value on the BA0, BA1 inputs selects ...

Page 51

READ The READ command is used to initiate a burst read access to an active row, as shown in Figure 19 on page 51. The value on the BA0, BA1 inputs selects the bank, and the address provided on inputs ...

Page 52

WRITE The WRITE command is used to initiate a burst write access to an active row as shown in Figure 20. The value on the BA0, BA1 inputs selects the bank, and the address provided on inputs A0–Ai and configuration, ...

Page 53

PRECHARGE (PRE) The PRECHARGE command is used to deactivate the open row in a particular bank or the open row in all banks as shown in Figure 21. The value on the BA0, BA1 inputs selects the bank, and the ...

Page 54

Operations INITIALIZATION Prior to normal operation, DDR SDRAMs must be powered up and initialized in a predefined manner. Operational procedures, other than those specified, may result in undefined operation. To ensure device operation, the DRAM must be initialized as described ...

Page 55

Figure 22: INITIALIZATION Flow Diagram Step PDF: 09005aef80768abb/Source: 09005aef80768abb DDR_x4x8x16_Core2.fm - 256Mb DDR: Rev. N, Core DDR: Rev. B ...

Page 56

Figure 23: INITIALIZATION Timing Diagram ( ( ) ) VTD REF ) ) ( ( CK ...

Page 57

REGISTER DEFINITION Mode Register The mode register is used to define the specific DDR SDRAM mode of operation. This definition includes the selection of a burst length, a burst type, a CAS latency, and an operating mode, as shown in ...

Page 58

Burst Length (BL) Read and write accesses to the DDR SDRAM are burst oriented, with the burst length being programmable for both READ and WRITE bursts, as shown in Figure 24 on page 57. The burst length determines the maximum ...

Page 59

CAS Latency (CL) The CL is the delay, in clock cycles, between the registration of a READ command and the availability of the first bit of output data. The latency can be set (-5B only) ...

Page 60

Table 36: CAS Latency Speed -5B -6/-6T -75E -75Z -75 Operating Mode The normal operating mode is selected by issuing an LMR command with bits A7–An each set to zero and bits A0–A6 set to the desired values. A DLL ...

Page 61

Figure 26: Extended Mode Register Definition Notes the most significant row address bit from Table 2 on page 2. 2. The reduced drive strength option is available only on Design ...

Page 62

Figure 27: Example: Meeting T0 T1 CK# CK Command ACT NOP Row Address Bank x BA0, BA1 READ During the READ command, the value on input A10 determines whether or not auto precharge is used. If auto precharge is selected, ...

Page 63

Data from any READ burst may be truncated with a BURST TERMINATE command, as shown in Figure 32 on page 68. The BURST TERMINATE latency is equal to the CL, that is, the BURST TERMINATE command should be issued x ...

Page 64

Figure 28: READ Burst T0 CK# CK READ Command Bank a, Address Col n DQS DQ T0 CK# CK READ Command Bank a, Address Col n DQS DQ T0 CK# CK READ Command Bank a, Address Col n DQS DQ ...

Page 65

Figure 29: Consecutive READ Bursts T0 CK# CK Command READ Bank, Address Col n DQS DQ T0 CK# CK Command READ Bank, Address Col n DQS DQ T0 CK# CK Command READ Bank, Address Col n DQS DQ Notes: 1. ...

Page 66

Figure 30: Nonconsecutive READ Bursts T0 CK# CK Command READ Bank, Address Col n DQS DQ T0 CK# CK Command READ Bank, Address Col n DQS DQ T0 CK# CK Command READ Bank, Address Col n DQS DQ Notes: 1. ...

Page 67

Figure 31: Random READ Accesses T0 CK# CK Command READ Bank, Address Col n DQS DQ T0 CK# CK Command READ Bank, Address Col n DQS DQ T0 CK# CK Command READ Bank, Address Col n DQS DQ Notes: 1. ...

Page 68

Figure 32: Terminating a READ Burst T0 CK# CK Command READ Bank a, Address Col n DQS DQ T0 CK# CK READ Command Bank a, Address Col n DQS DQ T0 CK# CK Command READ Bank a, Address Col n ...

Page 69

Figure 33: READ-to-WRITE T0 CK# CK Command READ Bank, Address Col n DQS CK# CK Command READ Bank, Address Col n DQS CK# CK READ Command Bank a, Address Col n DQS DQ DM ...

Page 70

Figure 34: READ-to-PRECHARGE T0 CK# CK Command READ Bank a, Address Col n DQS DQ T0 CK# CK Command READ Bank a, Address Col n DQS DQ T0 CK# CK Command READ Bank a, Address Col n DQS DQ Notes: ...

Page 71

Figure 35: Bank READ – Without Auto Precharge CKE Command NOP ACT Row Address A10 Row BA0, ...

Page 72

Figure 36: x4, x8 Data Output Timing – DQ (first data no longer valid) DQ (first data no longer valid) All DQ and DQS collectively t Notes the lesser DQSQ is derived at each ...

Page 73

Figure 37: x16 Data Output Timing – CK# CK LDQS (last data valid (first data no longer valid (last data valid) ...

Page 74

Figure 38: Data Output Timing – CK (MIN) DQS or LDQS/UDQS 3 DQ (last data valid) DQ (first data valid) All DQ values collectively 4 Notes: 1. READ command with issued at T0. t ...

Page 75

Data for any WRITE burst may be concatenated with or truncated with a subsequent WRITE command. In either case, a continuous flow of input data can be maintained. The new WRITE command can be issued on any positive edge of ...

Page 76

Figure 39: WRITE Burst Command Address t DQSS (NOM) t DQSS (MIN) t DQSS (MAX) Notes data-in for column b. 2. Three subsequent elements of data-in are applied in the programmed order following ...

Page 77

Figure 40: Consecutive WRITE-to-WRITE T0 CK# CK WRITE Command Bank, Address Col b t DQSS (NOM) DQS DQ DM Notes ( data-in from column b (or column n). 2. Three subsequent elements of data-in are ...

Page 78

Figure 41: Nonconsecutive WRITE-to-WRITE Command Address t DQSS (NOM) Notes ( data-in from column b (or column n). 2. Three subsequent elements of data-in are applied in the programmed order following Three ...

Page 79

Figure 43: WRITE-to-READ – Uninterrupting T0 CK# CK Command WRITE Bank a, Address Col DQSS (NOM) DQSS DQS DQSS (MIN) DQSS DQS DQSS (MAX) DQSS DQS DQ ...

Page 80

Figure 44: WRITE-to-READ – Interrupting T0 CK# CK Command WRITE Bank a, Address Col DQSS (NOM) DQSS DQS DQSS (MIN) DQSS DQS DQSS (MAX) DQSS DQS DQ ...

Page 81

Figure 45: WRITE-to-READ – Odd Number of Data, Interrupting T0 CK# CK Command WRITE Bank a, Address Col b t DQSS (NOM) t DQSS DQS DQSS (MIN) t DQSS DQS DQSS (MAX) ...

Page 82

Figure 46: WRITE-to-PRECHARGE – Uninterrupting T0 CK# CK Command WRITE Bank a, Address Col b t DQSS (NOM) t DQSS DQS DQSS (MIN) t DQSS DQS DQSS (MAX) t DQSS DQS DQ ...

Page 83

Figure 47: WRITE-to-PRECHARGE – Interrupting T0 CK# CK Command WRITE Bank a, Address Col b t DQSS (NOM) t DQSS DQS DQSS (MIN) t DQSS DQS DQSS (MAX) t DQSS DQS DQ ...

Page 84

Figure 48: WRITE-to-PRECHARGE – Odd Number of Data, Interrupting T0 CK# CK Command WRITE Bank a, Address Col b t DQSS (NOM) t DQSS DQS DQSS (MIN) t DQSS DQS DQSS (MAX) ...

Page 85

Figure 49: Bank WRITE – Without Auto Precharge CKE NOP 1 ACT Command Row Address A10 Row BA0, ...

Page 86

Figure 50: WRITE – DM Operation CKE ACT NOP Command Row Address A10 Row BA0, BA1 Bank ...

Page 87

Figure 51: Data Input Timing CK# CK DQS DQ DM Notes: 1. WRITE command issued at T0 DSH (MIN) generally occurs during t 3. DSS (MIN) generally occurs during 4. For x16, LDQS controls the lower byte and ...

Page 88

Figure 52: Bank READ – with Auto Precharge CKE ACT NOP Command Address Row A10 Row IS IH BA0, BA1 Bank ...

Page 89

Figure 53: Bank WRITE – with Auto Precharge CKE Command NOP ACT Address Row A10 Row BA0, ...

Page 90

Although not a JEDEC requirement, to provide for future functionality features, CKE must be active (HIGH) during the AUTO REFRESH period. The AUTO REFRESH period begins when the AUTO REFRESH command is registered and ends Figure 54: Auto Refresh Mode ...

Page 91

NOPs for 200 additional clock cycles before applying a READ. Any command other than a READ can be performed reset. NOP or DESELECT commands must be issued during the Figure 55: Self Refresh Mode T1 ...

Page 92

Power-down (CKE Not Active) Unlike SDR SDRAMs, DDR SDRAMs require CKE to be active at all times an access is in progress, from the issuing of a READ or WRITE command, until completion of the access. Thus a clock suspend ...

Page 93

Figure 56: Power-Down Mode CK# CK CKE Command Address DQS DQ DM Notes: 1. Once initialized this command is a PRECHARGE (or if the device is already in the idle state), then the power-down mode shown is ...

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