mt29f2g16abdhc-et Micron Semiconductor Products, mt29f2g16abdhc-et Datasheet

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mt29f2g16abdhc-et

Manufacturer Part Number
mt29f2g16abdhc-et
Description
2gb, 4gb, 8gb X8, X16 Nand Flash Memory
Manufacturer
Micron Semiconductor Products
Datasheet

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mt29f2g16abdhc-et:D
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Part Number:
mt29f2g16abdhc-et:D
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Part Number:
mt29f2g16abdhc-et:D TR
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NAND Flash Memory
MT29F2G08AACWP, MT29F4G08BACWP, MT29F8G08FACWP
For the latest data sheet, refer to the Micron Web site: www.micron.com/products/nand/
Features
• Organization
• READ performance
• WRITE performance
• Endurance: 100,000 PROGRAM/ERASE cycles
• First block (block address 00h) guaranteed to be
• V
• Automated PROGRAM and ERASE
• Basic NAND Flash command set:
• New commands:
• Operation status byte provides a software method of
• READY/BUSY (R/B#) pin provides a hardware
• WP# pin: hardware write protect
PDF: 09005aef814b01a2 / Source: 09005aef814b01c7
2_4_8gb_nand_m49a__1.fm - Rev. D 12/06 EN
– Page size x8: 2,112 bytes (2,048 + 64 bytes)
– Page size x16: 1,056 words (1,024 + 32 words)
– Block size: 64 pages (128K + 4K bytes)
– Device size: 2Gb: 2,048 blocks; 4Gb: 4,096 blocks;
– Random READ: 25µs
– Sequential READ: 30ns (3V x8 only)
– PROGRAM PAGE: 300µs (TYP)
– BLOCK ERASE: 2ms (TYP)
– PAGE READ, READ for INTERNAL DATA MOVE,
– PAGE READ CACHE MODE
– One-time programmable (OTP), including:
– READ UNIQUE ID (contact factory)
– READ ID2 (contact factory)
– PROGRAM/ERASE operation completion
– PROGRAM/ERASE pass/fail condition
– Write-protect status
valid without ECC (up to 1,000 PROGRAM/ERASE
cycles)
detecting:
method of detecting PROGRAM or ERASE cycle
completion
8Gb: 8,192 blocks
RANDOM DATA READ, READ ID, READ STATUS,
PROGRAM PAGE, RANDOM DATA INPUT, PRO-
GRAM PAGE CACHE MODE, PROGRAM for
INTERNAL DATA MOVE, BLOCK ERASE, RESET
CC
OTP DATA PROGRAM, OTP DATA PROTECT,
OTP DATA READ
: 1.70V–1.95V
Products and specifications discussed herein are subject to change by Micron without notice.
1
or 2.7V–3.6V
1
2Gb, 4Gb, 8Gb: x8, x16 NAND Flash Memory
Figure 1:
Options
• Density:
• Device width:
• Configuration:
• V
• Third-generation die
• Package:
• Operating temperature:
Notes: 1. Packaged parts are only available for 3V x8
– 2Gb (single die)
– 4Gb (dual-die stack)
– 8Gb (quad-die stack)
– x8
– x16
– 2.7V–3.6V
– 1.70V–1.95V
– 48-Pin TSOP type I (lead-free)
– Commercial (0°C to 70°C)
– Extended (–40°C to +85°C)
CC
Micron Technology, Inc., reserves the right to change products or specifications without notice.
:
2. For ET devices, contact factory.
1
# of die # of CE# # of R/B#
devices. For 1.8V or x16 devices, contact
factory.
1
2
4
48-Pin TSOP Type 1
1
1
1
2
©2005 Micron Technology, Inc. All rights reserved.
2
1
1
2
MT29Fxx08x
MT29Fxx16x
Marking
MT29F2G
MT29F4G
MT29F8G
None
Features
WP
ET
A
B
A
B
C
F

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