km29w32000ait Samsung Semiconductor, Inc., km29w32000ait Datasheet - Page 10

• Manufacturer Part Number: km29w32000ait
• Description: 8-bit Nand Flash Memory
• Manufacturer: Samsung Semiconductor, Inc.

KM29W32000AT, KM29W32000AIT
ECC
Error in write or read operation
Over its life time, the additional invalid blocks may occur. Though the tight process control and intensive testing, Samsung minimizes
the additional block failure rate, which is projected far below 0.1% up until 1million program/erase cycles. Refer to the qualification
report for the actual data.The following possible failure modes should be considered to implement a highly reliable system.
NAND Flash Technical Notes (Continued)
Program Flow Chart
Program Error
Write
Read
*
No
Single Bit Failure
: Error Correcting Code --> Hamming Code etc.
Failure Mode
Program Failure
Erase Failure
Example) 1bit correction & 2bit detection
Write Address
or R/B = 1 ?
SR. 0 = 0 ?
SR. 6 = 1 ?
Write Data
Write 10H
Write 70H
Write 80H
Start
Yes
Yes
No
10
*
Status Read after Erase --> Block Replacement
Status Read after Program --> Block Replacement
Read back ( Verify after Program) --> Block Replacement
Verify ECC -> Block Replacement or ECC Correction
: If program operation results in an error, map out
the block including the page in error and copy the
target data to another block.
Detection and Countermeasure sequence
Program Completed
Wait for tR Time
Write Address
If ECC is used, this verification
operation is not needed.
Verify Data
Write 00H
Yes
FLASH MEMORY
No
or ECC Correction
Program Error
*