l29c525 LOGIC Devices Incorporated, l29c525 Datasheet - Page 5

• Manufacturer Part Number: l29c525
• Description: Dual Pipeline Register
• Manufacturer: LOGIC Devices Incorporated

DEVICES INCORPORATED
1. Maximum Ratings indicate stress
specifications only. Functional oper-
ation of these products at values beyond
those indicated in the Operating Condi-
tions table is not implied. Exposure to
maximum rating conditions for ex-
tended periods may affect reliability.
2. The products described by this spec-
ification include internal circuitry de-
signed to protect the chip from damag-
ing substrate injection currents and ac-
cumulations of static charge. Neverthe-
less, conventional precautions should
be observed during storage, handling,
and use of these circuits in order to
avoid exposure to excessive electrical
stress values.
3. This device provides hard clamping of
transient undershoot and overshoot. In-
put levels below ground or above V
will be clamped beginning at –0.6 V and
V
indefinite operation with inputs in the
range of –0.5 V to +7.0 V. Device opera-
tion will not be adversely affected, how-
ever, input current levels will be well in
excess of 100 mA.
4. Actual test conditions may vary from
those designated but operation is guar-
anteed as specified.
5. Supply current for a given applica-
tion can be accurately approximated by:
where
6. Tested with all outputs changing ev-
ery cycle and no load, at a 5 MHz clock
rate.
7. Tested with all inputs within 0.1 V of
V
8. These parameters are guaranteed
but not 100% tested.
NOTES
N = total number of device outputs
C = capacitive load per output
V = supply voltage
F = clock frequency
CC
CC
or Ground, no load.
+ 0.6 V. The device can withstand
NCV F
4
2
CC
9. AC specifications are tested with
input transition times less than 3 ns,
output reference levels of 1.5 V (except
t
0 to 3.0 V. Output loading may be a
resistive divider which provides for
specified I
voltage of V
respectively. Alternatively, a diode
bridge with upper and lower current
sources of I
and a balancing voltage of 1.5 V may be
used. Parasitic capacitance is 30 pF
minimum, and may be distributed.
This device has high-speed outputs ca-
pable of large instantaneous current
pulses and fast turn-on/turn-off times.
As a result, care must be exercised in the
testing of this device. The following
measures are recommended:
a. A 0.1 µF ceramic capacitor should be
installed between V
leads as close to the Device Under Test
(DUT) as possible. Similar capacitors
should be installed between device V
and the tester common, and device
ground and tester common.
b. Ground and V
must be brought directly to the DUT
socket or contactor fingers.
c. Input voltages should be adjusted to
compensate for inductive ground and V
noise to maintain required DUT input
levels relative to the DUT ground pin.
10. Each parameter is shown as a min-
imum or maximum value. Input re-
quirements are specified from the point
of view of the external system driving
the chip. Setup time, for example, is
specified as a minimum since the exter-
nal system must supply at least that
much time to meet the worst-case re-
quirements of all parts. Responses from
the internal circuitry are specified from
the point of view of the device. Output
delay, for example, is specified as a
maximum since worst-case operation of
any device always provides data within
that time.
DIS
test), and input levels of nominally
OH
OH
OH
and I
and I
min and V
5
CC
OL
CC
OL
supply planes
at an output
respectively,
and Ground
OL
max
CC
CC
11. For the t
measured to the 1.5 V crossing point
with datasheet loads. For the t
the transition is measured to the
±200mV level from the measured
steady-state output voltage with
±10mA loads. The balancing volt-
age, V
and 0-to-Z tests, and set at 0 V for Z-
to-1 and 1-to-Z tests.
12. These parameters are only tested at
the high temperature extreme, which is
the worst case for leakage current.
DUT
Z
Z
F
F
IGURE
OE
IGURE
0
1
V
Dual Pipeline Register
V
OL
OH
TH
*
*
Measured V
Measured V
A. O
C
1.5 V
t
, is set at 3.5 V for Z-to-0
L
B. T
ENA
Pipeline Registers
ENA
S1
UTPUT
1.5 V
1.5 V
OL
OH
HRESHOLD
with I
with I
test, the transition is
OH
OH
V
V
OH
= –10mA and I
03/32/2000–LDS.29C525-G
L
OL
= –10mA and I
1.5 V
*
*
OADING
I
OH
0.2 V
0.2 V
t
DIS
L29C525
L
OL
OL
EVELS
= 10mA
C
= 10mA
V
DIS
TH
IRCUIT
3.5V Vth
0
1
0V Vth
test,
I
Z
Z
OL