k6x0808t1d Samsung Semiconductor, Inc., k6x0808t1d Datasheet - Page 7

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k6x0808t1d

Manufacturer Part Number
k6x0808t1d
Description
32kx8 Bit Low Power Cmos Static Ram
Manufacturer
Samsung Semiconductor, Inc.
Datasheet

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K6X0808T1D Family
DATA RETENTION WAVE FORM
CS controlled
V
3.0V/2.7V
2.2V
V
CS
GND
TIMING WAVEFORM OF WRITE CYCLE(2)
TIMING WAVEFORM OF WRITE CYCLE(1)
CC
DR
Address
CS
WE
Data in
Data out
NOTES (WRITE CYCLE)
1. A write occurs during the overlap of a low CS and a low WE. A write begins at the latest transition among CS going Low and WE
2. t
3. t
4. t
Address
CS
WE
Data in
Data out
going low : A write end at the earliest transition among CS going high and WE going high, t
to the end of write.
CW
AS
WR
is measured from the address valid to the beginning of write.
is measured from the CS going low to the end of write.
is measured from the end or write to the address change. t
Data Undefined
t
SDR
High-Z
t
t
AS(3)
AS(3)
(CS Controlled)
(WE Controlled)
Data Retention Mode
7
WR
CS V
t
WHZ
t
AW
applied in case a write ends as CS or WE going high.
t
AW
t
t
WC
CW(2)
CC
t
CW(2)
t
WC
- 0.2V
t
t
WP(1)
WP(1)
t
t
DW
DW
Data Valid
Data Valid
WP
is measured from the begining of write
t
t
WR(4)
WR(4)
t
t
DH
DH
t
OW
t
RDR
CMOS SRAM
High-Z
December 2003
Revision 1.0

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