EVAL-AD5447EBZ Analog Devices Inc, EVAL-AD5447EBZ Datasheet - Page 15

• Manufacturer Part Number: EVAL-AD5447EBZ
• Description: BOARD EVALUATION FOR AD5447
• Manufacturer: Analog Devices Inc

Specifications of EVAL-AD5447EBZ

• Number Of Dac's: 2
• Number Of Bits: 12
• Outputs And Type: 2, Single Ended
• Sampling Rate (per Second): 21.3M
• Data Interface: Parallel
• Settling Time: 80ns
• Dac Type: Current
• Voltage Supply Source: Single
• Operating Temperature: -40°C ~ 125°C
• Utilized Ic / Part: AD5447
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

TERMINOLOGY
Relative Accuracy (Endpoint Nonlinearity)
A measure of the maximum deviation from a straight line
passing through the endpoints of the DAC transfer function. It
is measured after adjusting for zero and full scale and is
typically expressed in LSBs or as a percentage of the full-scale
reading.
Differential Nonlinearity
The difference in the measured change and the ideal 1 LSB
change between two adjacent codes. A specified differential
nonlinearity of −1 LSB maximum over the operating
temperature range ensures monotonicity.
Gain Error (Full-Scale Error)
A measure of the output error between an ideal DAC and the
actual device output. For these DACs, ideal maximum output is
V
with an external resistance.
Output Leakage Current
The current that flows into the DAC ladder switches when they
are turned off. For the I
loading all 0s to the DAC and measuring the I
Minimum current flows into the I
loaded with all 1s.
Output Capacitance
Capacitance from I
Output Current Settling Time
The amount of time for the output to settle to a specified level
for a full-scale input change. For these devices, it is specified
with a 100 Ω resistor to ground.
Digital-to-Analog Glitch Impulse
The amount of charge injected from the digital inputs to the
analog output when the inputs change state. This is normally
specified as the area of the glitch in either pA-sec or nV-sec,
depending on whether the glitch is measured as a current or
voltage signal.
REF
– 1 LSB. The gain error of the DACs is adjustable to zero
OUT
1 or I
OUT
1 terminal, it can be measured by
OUT
2 to AGND.
OUT
2 line when the DAC is
OUT
1 current.
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Digital Feedthrough
When the device is not selected, high frequency logic activity
on the device’s digital inputs is capacitively coupled through the
device and produces noise on the I
on the following circuitry. This noise is digital feedthrough.
Multiplying Feedthrough Error
The error due to capacitive feedthrough from the DAC
reference input to the DAC I
loaded to the DAC.
Total Harmonic Distortion (THD)
The DAC is driven by an ac reference. The ratio of the rms sum
of the harmonics of the DAC output to the fundamental value is
the THD. Usually only the lower-order harmonics are included,
such as second to fifth harmonics.
Digital Intermodulation Distortion
Second-order intermodulation distortion (IMD) measurements
are the relative magnitude of the fa and fb tones digitally generated
by the DAC and the second-order products at 2fa − fb and
2fb − fa.
Spurious-Free Dynamic Range (SFDR)
SFDR is the usable dynamic range of a DAC before spurious
noise interferes or distorts the fundamental signal. SFDR is the
measure of difference in amplitude between the fundamental
and the largest harmonic or nonharmonic spur from dc to full
Nyquist bandwidth (half the DAC sampling rate, or fs/2).
Narrow-band SFDR is a measure of SFDR over an arbitrary
window size, in this case 50%, of the fundamental. Digital SFDR
is a measure of the usable dynamic range of the DAC when the
signal is a digitally generated sine wave.
THD

20
log
V
2
2

AD5428/AD5440/AD5447
V
OUT
3
2
V

1 terminal when all 0s are
1
V
OUT
4
2

pins and, subsequently,
V
5
2