EVAL-AD5447EBZ Analog Devices Inc, EVAL-AD5447EBZ Datasheet - Page 6

• Manufacturer Part Number: EVAL-AD5447EBZ
• Description: BOARD EVALUATION FOR AD5447
• Manufacturer: Analog Devices Inc

Specifications of EVAL-AD5447EBZ

• Number Of Dac's: 2
• Number Of Bits: 12
• Outputs And Type: 2, Single Ended
• Sampling Rate (per Second): 21.3M
• Data Interface: Parallel
• Settling Time: 80ns
• Dac Type: Current
• Voltage Supply Source: Single
• Operating Temperature: -40°C ~ 125°C
• Utilized Ic / Part: AD5447
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

AD5428/AD5440/AD5447
ABSOLUTE MAXIMUM RATINGS
Transient currents of up to 100 mA do not cause SCR latch-up.
T
Table 3.
Parameter
V
V
I
Logic Inputs and Output
Operating Temperature Range
Storage Temperature Range
Junction Temperature
20-lead TSSOP θ
24-lead TSSOP θ
Lead Temperature, Soldering (10 sec)
IR Reflow, Peak Temperature (<20 sec)
1
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
OUT
Overvoltages at DBx, CS , and R/ W are clamped by internal diodes.
DD
REF
A
Automotive (Y Version)
= 25°C, unless otherwise noted.
1, I
A, V
to GND
OUT
REF
2 to DGND
B, R
FB
A, R
JA
JA
Thermal Impedance
Thermal Impedance
FB
B to DGND
1
Rating
–0.3 V to +7 V
–12 V to +12 V
–0.3 V to +7 V
–0.3 V to V
–40°C to +125°C
–65°C to +150°C
150°C
143°C/W
128°C/W
300°C
235°C
DD
+ 0.3 V
Rev. B | Page 6 of 32
Stresses above those listed in Absolute Maximum Ratings may
cause permanent damage to the device. This is a stress rating
only; functional operation of the device at these or any other
conditions above those listed in the operational sections of this
specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device
reliability. Only one absolute maximum rating may be applied
at any one time.