SCANPSC110F National Semiconductor, SCANPSC110F Datasheet
SCANPSC110F
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SCANPSC110F Summary of contents
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... Each SCANPSC110F Bridge supports local scan rings which can be accessed individually or com- bined serially. Addressing is accomplished by loading the in- struction register with a value matching that of the Slot in- puts ...
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... L1 Local Local is used to describe IEEE Std. 1149.1 compliant scan rings and the SCANPSC110F Bridge Test Access Port that drives them. The term “local” was adopted from the system test architecture that the ’PSC110F Bridge will most commonly be used in; namely, a system test backplane with a ’ ...
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... TABLE 2. Detailed Pin Description Table Description BACKPLANE TEST MODE SELECT: Controls sequencing through the TAP Controller of the SCANPSC110F Bridge. Also controls sequencing of the TAPs which are on the three (3) local scan chains. BACKPLANE TEST DATA INPUT: All backplane scan data is supplied to the ’ ...
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... GND Ground potential 14, 21 Note 1: All pins are active HIGH unless otherwise noted. Overview of SCANPSC110F Bridge Functions FIGURE 1. SCANPSC110F Bridge Architecture SCANPSC110F BRIDGE ARCHITECTURE Figure 1 shows the basic architecture of the ’PSC110F. The device’s major functional blocks are illustrated here. The TAP Controller, a 16-state state machine, is the central con- trol for the device ...
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... Functions (Continued) In multi-drop scan systems, a scan tester can select indi- vidual ’PSC110Fs for participation in upcoming scan opera- tions. ’PSC110F “selection” is accomplished by simulta- neously scanning a device address out to multiple FIGURE 2. SCANPSC110F Bridge State Machines The ’PSC110F contains three distinct state-machines (see Figure 2 ). The first of these is the TAP-control state-machine, which is used to drive the ’ ...
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... ADDR = 6-bit address in the Instruction Register SLOT = Static address in the ’PSC110F Selection Controller FIGURE 3. State Machine for SCANPSC110F Bridge Selection Controller FIGURE 4. Local SCANPSC110F Bridge Port Configuration State Machine The ’PSC110F’s scan port-configuration state-machine is used to control the insertion of local scan ports into the over- all scan chain, or the isolation of local ports from the chain. From the perspective of a system’ ...
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... Level-2 instructions for functions other than local scan port confguration. These instructions provide access to and control of various regis- ters within the ’PSC110F. This set instructions includes: FIGURE 5. Relationship Between SCANPSC110F Bridge State Machines BYPASS CNTRSEL EXTEST ...
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... Register Set The SCANPSC110F Bridge includes a number of registers which are used for ’PSC110F selection and configuration, scan data manipulation, and scan-support operations. These registers can be grouped as shown in Table 3 . ...
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... Hierarchical Test Support Multiple SCANPSC110F Bridges can be used to assemble a hierarchical boundary-scan tree. In such a configuration, the system tester can configure the local ports of a set of ’PSC110Fs connect a specific set of local scan-chains to the active scan chain. Using this capability, the tester can selectively communicate with specific portions of a target system. The tester’ ...
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... Level 1 Protocol (Continued) TABLE 4. SCANPSC110F Bridge Address Modes Address Types Hex Address (Note 2) Direct Address Broadcast Address Multi-Cast Group 0 Multi-Cast Group 1 Multi-Cast Group 2 Multi-Cast Group 3 Note 2: Hex address ’7X’, ’BX’, or ’FX’ may be used instead of ’3X’. Note 3: Only the six (6) LSB’s of the address is compared to the S DIRECT ADDRESSING The ’ ...
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... FIGURE 7. Broadcast Addressing: Address Loaded into Instruction Register FIGURE 8. Multi-Cast Addressing: Address Loaded into Instruction Register Level 2 Protocol Once the SCANPSC110F Bridge has been successfully ad- dressed and selected, its internal registers may be accessed via Level-2 Protocol. Level-2 Protocol is compliant to IEEE Std. 1149.1 TAP protocol with one exception: if the ’ ...
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Level 2 Protocol (Continued) 1. Instructions that insert a ’PSC110F register into the ac- tive scan chain so that the register can be captured or updated (BYPASS, SAMPLE/PRELOAD, EXTEST, ID- CODE, MODESEL, MCGRSEL, LFSRSEL, CNTRSEL). 2. Instructions that configure local ...
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Level 2 Protocol (Continued) one of the TAP Controller pause states. A local port does not become parked until the ’PSC110F’s TAP Controller is se- quenced through Exit1-DR/IR into the Update-DR/IR state. When the ’PSC110F TAP Controller is in the ...
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... The instruction shift register is an 8-bit register that is in se- ries with the scan chain whenever the TAP Controller of the SCANPSC110F Bridge is in the Shift-IR state. Upon exiting the Capture-IR state, the value “XXXXXX01” is captured into the instruction register, where “XXXXXX” represents the value on the S inputs ...
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Register Descriptions (Continued) TABLE 7. Mode Register Control of LSPN Mode Register XXX0X000 XXX0X001 XXX0X010 XXX0X011 XXX0X100 XXX0X101 XXX0X110 XXX0X111 XXX1XXXX X = don’t care Register = ’PSC110F instruction register or any of the ’PSC110F test data registers PAD = ...
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... Special Features BIST SUPPORT The sequence of instructions to run BIST testing on a parked SCANPSC110F Bridge port is as follows: 1. Pre-load the Boundary register of the device under test if needed. 2. Initialize the TCK counter to 00000000 Hex. Note that the TCK counter is initialized to 00000000 Hex upon Test-Logic-Reset , so this step may not be necessary. 3. Issue the CNTRON instruction to the ’ ...
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Special Features (Continued) Update-IR were Select-DR , TMS would remain low and L synchronization would not occur until the ’PSC110F TAP Controller entered the Run-Test/Idle state, as shown in Fig- ure 11 . Each local port has its own Local ...
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... V Maximum Low OL (TDO ) Output Voltage B www.national.com (Note 5) ESD Last Passing Voltage (Min) Recommended Operating Conditions −0.5V to +7.0V Supply Voltage (V SCANPSC110F −20 mA Input Voltage (V I +20 mA Output Voltage (V −0. +0.5V CC Operating Temperature (T Military −20 mA Minimum Input Edge Rate dV/dt +20 mA SCAN “F” Series Devices − ...
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DC Electrical Characteristics Symbol Parameter I (OE, Maximum Input IN TCK , S ) Leakage Current B (0–5) I Maximum Input IN, MAX (TRST, TDI , Leakage Current Ln TDI , TMS ) Maximum Input IN, MAX ...
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AC Electrical Characteristics Symbol Parameter t , Propagation Delay PHL t TCK to TCK PLH B Ln TCK to TCK Propagation Delay PHL t TCK to TDO PLH B Ln TCK to TDO ...
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AC Electrical Characteristics Symbol Parameter t Setup Time S TMS to TCK Hold Time H TMS to TCK Setup Time S TDI to TCK Hold Time H TdI to TCK B ...
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... C Output Pin Capacitance OUT C Power Dissipation Capacitance PD AC Waveforms FIGURE 13. Waveforms for an Unparked SCANPSC110F Bridge in the SHIFT-DR (IR) TAP Controller State Note A: V and V are measured with respect to ground reference. OHV OLP Note B: Input pulses have the following characteristics MHz, t FIGURE 14. Quiet Output Noise Voltage Waveform www ...
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AC Waveforms (Continued) FIGURE 16. Output Enable Waveforms FIGURE 15. Reset Waveforms 23 DS100327-18 DS100327-19 www.national.com ...
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... FIGURE 17. IEEE 1149.1 TAP Controller State Diagram Applications Example FIGURE 18. Boundary Scan Backplane with 10 Card Slots, 8 Slots Are Filled with Boards The following sequence gives an example of how one might use the SCANPSC110F Bridge to perform 1149.1 operations www.national.com DS100327-17 via a multi-drop scan backplane. The system involved has 10 card slots which are filled with modules, and 2 slots are empty ...
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... Applications Example (Continued) More Information can be found in Application Notes: AN-1023 Structural System Test via IEEE Std. 1149.1 with SCANPSC110F Hierarchical and Multidrop Ad- dressable JTAG Port AN-1022 Boundary Scan, An Enabling Technology for System Level Embedded Test 1. After the system is powered up a level-1 reset is per- formed via the TRST input. All TAP Controllers (both ’ ...
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Applications Example (Continued) 8. Assume that boards # and # 8 are identical, so that it is possible to test them simultaneously. The tester first addresses Board # 6. Next the MCGRSEL instruction is issued to place ...
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Applications Example (Continued) 27 www.national.com ...
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Physical Dimensions inches (millimeters) unless otherwise noted www.national.com 28-Pin Leadless Chip Carrier (LCC) NS Package Number E28A 28-Pin Ceramic DIP NS Package Number J28A 28 ...
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... NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant ...