SCAN182373ASSC Fairchild Semiconductor, SCAN182373ASSC Datasheet

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SCAN182373ASSC

Manufacturer Part Number
SCAN182373ASSC
Description
IC TRANSPARENT LATCH 8BIT 56SSOP
Manufacturer
Fairchild Semiconductor
Series
SCANr
Datasheet

Specifications of SCAN182373ASSC

Logic Type
D-Type Transparent Latch
Circuit
9:9
Output Type
Tri-State
Voltage - Supply
4.5 V ~ 5.5 V
Independent Circuits
2
Delay Time - Propagation
4.5ns
Current - Output High, Low
32mA, 15mA
Operating Temperature
-40°C ~ 85°C
Mounting Type
Surface Mount
Package / Case
56-SSOP
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
© 2000 Fairchild Semiconductor Corporation
SCAN182373ASSC
SCAN182373A
Transparent Latch with 25
General Description
The SCAN182373A is a high performance BiCMOS trans-
parent latch featuring separate data inputs organized into
dual 9-bit bytes with byte-oriented latch enable and output
enable control signals. This device is compliant with IEEE
1149.1 Standard Test Access Port and Boundary-Scan
Architecture with the incorporation of the defined boundary-
scan test logic and test access port consisting of Test Data
Input (TDI), Test Data Out (TDO), Test Mode Select (TMS),
and Test Clock (TCK).
Ordering Code:
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Connection Diagram
Order Number
Package
Number
MS56A
56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide
DS011544
Series Resistor Outputs
Features
Pin Descriptions
AI
ALE, BLE
AOE
AO
IEEE 1149.1 (JTAG) Compliant
High performance BiCMOS technology
25
terminating resistors
Buffered active-low latch enable
3-STATE outputs for bus-oriented applications
25 mil pitch SSOP (Shrink Small Outline Package)
Includes CLAMP, IDCODE and HIGHZ instructions
Additional instructions SAMPLE-IN, SAMPLE-OUT and
EXTEST-OUT
Power up 3-STATE for hot insert
Member of Fairchild’s SCAN Products
(0–8)
(0–8)
Pin Names
1
, BOE
, BI
Package Description
series resistor outputs eliminate need for external
, BO
(0–8)
1
(0–8)
Data Inputs
Latch Enable Inputs
3-STATE Output Enable Inputs
3-STATE Latch Outputs
January 1993
Revised August 2000
Description
www.fairchildsemi.com

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SCAN182373ASSC Summary of contents

Page 1

... Test Clock (TCK). Ordering Code: Package Order Number Number SCAN182373ASSC MS56A 56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code. Connection Diagram © 2000 Fairchild Semiconductor Corporation ...

Page 2

Truth Tables Inputs †AOE ALE AI (0– HIGH Voltage Level L LOW Voltage Level X Immaterial Z High Impedance Functional Description The SCAN182373A consists of two ...

Page 3

Block Diagrams Note: BSR stands for Boundary Scan Register. Byte-A Tap Controller Byte-B 3 www.fairchildsemi.com ...

Page 4

Description of BOUNDARY-SCAN Circuitry The scan cells used in the BOUNDARY-SCAN register are one of the following two types depending upon their loca- tion. Scan cell TYPE1 is intended to solely observe system data, while TYPE2 has the additional ability ...

Page 5

BOUNDARY-SCAN Register Scan Chain Definition (42 Bits in Length) 5 www.fairchildsemi.com ...

Page 6

Scan Chain Definition (22 Bits in Length) www.fairchildsemi.com Input BOUNDARY-SCAN Register When Sample In is Active 6 ...

Page 7

Output BOUNDARY-SCAN Register Scan Chain Definition (20 Bits in Length) When Sample Out and Extent Out are Active 7 www.fairchildsemi.com ...

Page 8

BOUNDARY-SCAN Register Definition Index Bit No. Pin Name 41 AOE 1 40 ALE 39 AOE 38 BOE 1 37 BLE 36 BOE ...

Page 9

Absolute Maximum Ratings Storage Temperature Ambient Temperature under Bias Junction Temperature under Bias V Pin Potential to Ground Pin CC Input Voltage (Note 2) Input Current (Note 5.0 mA Voltage Applied to Any Output in Disabled ...

Page 10

AC Electrical Characteristics Normal Operation: Symbol Parameter t Propagation Delay PLH PHL t Propagation Delay PLH PHL t Disable Time PLZ t PHZ t Enable Time PZL t PZH Note 4: Voltage ...

Page 11

AC Operating Requirements Scan Test Operation: Symbol Parameter t Setup Time, S Data to TCK (Note 8) t Hold Time, H Data to TCK (Note 8) t Setup Time AOE , BOE to TCK (Note 9) ...

Page 12

Physical Dimensions inches (millimeters) unless otherwise noted 56-Lead Shrink Small Outline Package (SSOP), JEDEC MO-118, 0.300 Wide Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right ...

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