CLP200M STMicroelectronics, CLP200M Datasheet - Page 9

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CLP200M

Manufacturer Part Number
CLP200M
Description
IC OVP/OCP TELECOM POWERSO-10
Manufacturer
STMicroelectronics
Datasheet

Specifications of CLP200M

Voltage - Working
200V
Technology
Mixed Technology
Number Of Circuits
2
Applications
Telecommunications
Package / Case
PowerSO-10 Exposed Bottom Pad
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Power (watts)
-
Voltage - Clamping
-

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3.2. Ringing mode
3.2.1. Lightning simulation test
Lightning phenomena are the most common surge
causes. The purpose of this test is to check the ro-
bustness of the CLP200M against these lightning
strikes.
Table 1 : Acceptance criteria and number of tests.
Fig. 13 : Lightning simulation test.
Fig. 14 : CLP200M response to a positive surge.
TEST ACCEPTANCE
GENERATOR
3a
3b
10/700µs
2
3
+/- 4kV
CRITERIA
I
A
A
B
B
TIPL
1/2 CLP200M
Rsense
GND
4
1 for each position of s
and 10 for transversal
NUMBER TO TESTS
10 for longitudinal A
10 for longitudinal B
TIPS
V
5
1
Rp
Fig. 15 : CLP200M response to a negative surge.
Figures 14 and 15 show that the remaining
overvoltage does not exceed +/- 260 V. The
CLP200M switches on within 0.7
stands the 100 A given by the CCITT K20 genera-
tor.
Consequently, the CLP200M totally fulfills this test.
3.2.2 Power induction
(Test 3a and 3b table 2/K20)
Surges of long duration with medium voltage value
are mainly produced by the proximity of a sub-
scriber line with an AC mains line or equipment.
The purpose of this test is to check the robustness
of the CLP200M against these capacitive coupling
disturbances.
Fig. 16 : Power inductance test.
TEST
3a
3b
V
300
300
(RMS)
R( )
600
200
Duration
s and with-
CLP200M
0.2s
?
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