STM8L152C4T6TR STMicroelectronics, STM8L152C4T6TR Datasheet - Page 108

IC MCU 8BIT 16KB FLASH 48LQFP

STM8L152C4T6TR

Manufacturer Part Number
STM8L152C4T6TR
Description
IC MCU 8BIT 16KB FLASH 48LQFP
Manufacturer
STMicroelectronics
Series
STM8L EnergyLiter
Datasheet

Specifications of STM8L152C4T6TR

Featured Product
STM32 Cortex-M3 Companion Products
Core Processor
STM8
Core Size
8-Bit
Speed
16MHz
Connectivity
I²C, IrDA, SPI, UART/USART
Peripherals
Brown-out Detect/Reset, DMA, IR, LCD, POR, PWM, WDT
Number Of I /o
41
Program Memory Size
16KB (16K x 8)
Program Memory Type
FLASH
Eeprom Size
1K x 8
Ram Size
2K x 8
Voltage - Supply (vcc/vdd)
1.8 V ~ 3.6 V
Data Converters
A/D 25x12b, D/A 1x12
Oscillator Type
Internal
Operating Temperature
-40°C ~ 85°C
Package / Case
*
Core
STM8
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
STM8L152C4T6TR
Manufacturer:
STMicroelectronics
Quantity:
10 000
Electrical parameters
108/122
Table 58.
1. Not tested in production.
Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models
can be simulated: human body model and charge device model. This test conforms to the
JESD22-A114A/A115A standard.
Table 59.
1. Data based on characterization results, not tested in production.
Static latch-up
Table 60.
V
V
Symbol
Symbol
ESD(HBM)
ESD(CDM)
S
EMI
LU: 3 complementary static tests are required on 6 parts to assess the latch-up
performance. A supply overvoltage (applied to each power supply pin) and a current
injection (applied to each input, output and configurable I/O pin) are performed on each
sample. This test conforms to the EIA/JESD 78 IC latch-up standard. For more details,
refer to the application note AN1181.
Symbol
LU
Peak level
EMI data
ESD absolute maximum ratings
Electrical sensitivities
Electrostatic discharge voltage
(human body model)
Electrostatic discharge voltage
(charge device model)
Parameter
Static latch-up class
(1)
Ratings
V
T
LQFP32
conforming to
IEC61967-2
A
DD
= +25 °C,
= 3.6 V,
Conditions
Doc ID 15962 Rev 6
Parameter
0.1 MHz to 30 MHz
30 MHz to 130 MHz
130 MHz to 1 GHz
SAE EMI Level
frequency band
Monitored
Conditions
T
A
= +25 °C
STM8L151xx, STM8L152xx
Max vs.
16 MHz
Maximum
value
-3
9
2
2000
4
Class
500
II
(1)
dBμV
Unit
Unit
V
-

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