IP4234CZ6 NXP Semiconductors, IP4234CZ6 Datasheet - Page 6

DIODE,ESD TVS,USB2.0,SOT457

IP4234CZ6

Manufacturer Part Number
IP4234CZ6
Description
DIODE,ESD TVS,USB2.0,SOT457
Manufacturer
NXP Semiconductors
Datasheet

Specifications of IP4234CZ6

Diode Type
ESD Protection
Operating Voltage
3V
No. Of Pins
6
Svhc
No SVHC (18-Jun-2010)
Ptc Fuse Case
SOT-457
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

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NXP Semiconductors
IP4234CZ6_1
Product data sheet
9.4 Reflow soldering
Key characteristics in reflow soldering are:
Table 6.
Table 7.
Moisture sensitivity precautions, as indicated on the packing, must be respected at all
times.
Studies have shown that small packages reach higher temperatures during reflow
soldering, see
Package thickness (mm)
< 2.5
Package thickness (mm)
< 1.6
1.6 to 2.5
> 2.5
2.5
Lead-free versus SnPb soldering; note that a lead-free reflow process usually leads to
higher minimum peak temperatures (see
reducing the process window
Solder paste printing issues including smearing, release, and adjusting the process
window for a mix of large and small components on one board
Reflow temperature profile; this profile includes preheat, reflow (in which the board is
heated to the peak temperature) and cooling down. It is imperative that the peak
temperature is high enough for the solder to make reliable solder joints (a solder paste
characteristic). In addition, the peak temperature must be low enough that the
packages and/or boards are not damaged. The peak temperature of the package
depends on package thickness and volume and is classified in accordance with
Table 6
SnPb eutectic process (from J-STD-020C)
Lead-free process (from J-STD-020C)
and
Figure
7
3.
Rev. 01 — 16 April 2009
Package reflow temperature ( C)
Volume (mm
< 350
235
220
Package reflow temperature ( C)
Volume (mm
< 350
260
260
250
Single USB 2.0 ESD protection to IEC 61000-4-2 level 4
3
3
)
)
Figure
350 to 2000
260
250
245
3) than a SnPb process, thus
220
220
350
IP4234CZ6
> 2000
260
245
245
© NXP B.V. 2009. All rights reserved.
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