PMBD7000,215 NXP Semiconductors, PMBD7000,215 Datasheet - Page 6

DIODE SW DBL 100V 215MA HS SOT23

PMBD7000,215

Manufacturer Part Number
PMBD7000,215
Description
DIODE SW DBL 100V 215MA HS SOT23
Manufacturer
NXP Semiconductors
Datasheet

Specifications of PMBD7000,215

Package / Case
SOT-23-3, TO-236-3, Micro3™, SSD3, SST3
Voltage - Forward (vf) (max) @ If
1.25V @ 150mA
Current - Reverse Leakage @ Vr
500nA @ 100V
Current - Average Rectified (io) (per Diode)
215mA (DC)
Voltage - Dc Reverse (vr) (max)
100V
Reverse Recovery Time (trr)
4ns
Diode Type
Standard
Speed
Fast Recovery =< 500ns, > 200mA (Io)
Diode Configuration
1 Pair Series Connection
Mounting Type
Surface Mount
Product
Switching Diodes
Peak Reverse Voltage
100 V
Forward Continuous Current
0.215 A
Max Surge Current
4 A
Configuration
Dual Series
Recovery Time
4 ns
Forward Voltage Drop
1.1 V
Maximum Reverse Leakage Current
0.5 uA
Operating Temperature Range
+ 150 C
Maximum Operating Temperature
+ 150 C
Minimum Operating Temperature
- 65 C
Mounting Style
SMD/SMT
Rectifier Type
Switching Diode
Peak Rep Rev Volt
100V
Avg. Forward Curr (max)
0.215A
Rev Curr
0.5uA
Peak Non-repetitive Surge Current (max)
4A
Forward Voltage
1.1@0.1AV
Operating Temp Range
-65C to 150C
Package Type
TO-236AB
Rev Recov Time
4ns
Operating Temperature Classification
Military
Mounting
Surface Mount
Pin Count
3
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
568-1736-2
933859210215
PMBD7000 T/R

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
PMBD7000,215
Manufacturer:
NEXPERIA/安世
Quantity:
20 000
NXP Semiconductors
8. Test information
PMBD7000
Product data sheet
Fig 6.
Fig 7.
R
V = V
(1) I
S
R
S
= 50 Ω
Reverse recovery time test circuit and waveforms
Forward recovery voltage test circuit and waveforms
R
R
= 50
I
+ I
= 1 mA
F
Ω
×
R
S
1 kΩ
8.1 Quality information
D.U.T.
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
450 Ω
I
F
D.U.T.
OSCILLOSCOPE
R
i
= 50 Ω
All information provided in this document is subject to legal disclaimers.
OSCILLOSCOPE
mga881
SAMPLING
R
i
= 50
Rev. 4 — 16 September 2010
Ω
I
V
R
10 %
t
r
t
10 %
r
90 %
input signal
90 %
input signal
t
p
t
p
Double high-speed switching diode
t
t
V
+ I
F
PMBD7000
V FR
output signal
output signal
© NXP B.V. 2010. All rights reserved.
t rr
mga882
(1)
t
6 of 12
t

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